參數(shù)資料
型號(hào): 2N2222ACSM-RHG4
廠商: SEMELAB LTD
元件分類: 小信號(hào)晶體管
英文描述: 600 mA, 40 V, NPN, Si, SMALL SIGNAL TRANSISTOR
封裝: HERMETIC SEALED, CERAMIC, LCC1-3
文件頁(yè)數(shù): 3/6頁(yè)
文件大小: 56K
代理商: 2N2222ACSM-RHG4
Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
E-mail: sales@semelab.co.uk
Website: http://www.semelab.co.uk
RADIATION TEST DATA
Total dose or TID is a long term degradation of electronics due to the culmative energy depoisted in a
material. Typical effects in 2N2222A bipolar transistors when exposed to ionising radiation include
variations in device parameters such as leakage current, gain or in some cases functional and
parametric failures. Significant sources of TID exposure in the space enviroment include trapped
electrons, trapped photons and solar protons.
TOTAL DOSE RADIATION TESTING
Sample devices from Semelab wafer stocks were assembled in standard LCC1 ceramic surface
mount packages. Testing was to an accumulated dose of approximately 120Krad(Si)and a dose rate
of 360 rad(Si)/hour.
The tests were performed at a qualified test house using a Cobalt 60 calibrated source.
DEVICE DETAILS
Part Number
2N2222ACSM
Production Lot:
AA0212C
Semelab Wafer Lot: TG5
IRRADIATION
STEPS
DOSE RATE
Krads/hr
ANNEALING STEPS
HRS
TEMPERATURE
°C
0 Krad
25
32 Krad
0.36
25
59 Krad
0.36
25
119 Krad
0.36
0
25
24
25
EXPERIMENTAL CONDITIONS
Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed
to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.
Semelab encourages customers to verify that datasheets are current before placing orders.
2N2222ACSM-RH
Document Number 5551
Issue 1
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