參數(shù)資料
型號(hào): 100370
廠商: National Semiconductor Corporation
英文描述: Low Power Universal Demultiplexer/Decoder(低功耗通用多路分解器/譯碼器)
中文描述: 低功耗通用多路解復(fù)用器/解碼器(低功耗通用多路分解器/譯碼器)
文件頁(yè)數(shù): 5/8頁(yè)
文件大?。?/td> 144K
代理商: 100370
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
0.3
T
C
= +25C
Min
0.4
T
C
= +125C
Min
0.40
Units
Conditions
Notes
Max
2.40
Max
2.20
Max
2.70
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Propagation Delay
E
na
, E
nb
to Output
Propagation Delay
A
na
, A
nb
to Output
Propagation Delay
H
a
, H
b
, H
c
to Output
Propagation Delay
M to Output
Transition Time
20% to 80%, 80% to 20%
ns
0.30
2.60
0.40
2.40
0.40
2.90
ns
(Notes 9, 10,
11)
0.30
2.60
0.40
2.40
0.40
2.40
ns
Figures 1, 2
0.40
3.10
0.60
2.80
0.70
3.70
ns
0.30
1.60
0.30
1.60
0.30
1.60
ns
(Note 12)
Note 9:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 10:
Screen tested 100% on each device at +25C, temperature only, Subgroup A9.
Note 11:
Sample tested (Method 5005, Table I) on each Mfg. lot at +25C, Subgroup A9, and at +125C, and 55C Temp., Subgroups A10 and A11.
Note 12:
Not tested at +25C, +125C and 55C Temperature (design characterization data).
Test Circuit
DS100311-7
Notes:
V
, V
= +2V, V
= 2.5V
L1 and L2 = equal length 50
impedance lines
R
T
= 50
terminator internal to scope
Decoupling 0.1 μF from GND to V
CC
and V
EE
All unused outputs are loaded with 50
to GND
C
L
= Fixture and stray capacitance
3 pF
Pin numbers shown are for flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
www.national.com
5
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100370D MB 32C 32#20 PIN PLUG
100370F MB 32C 32#20 PIN PLUG
100370PC MB 32C 32#20 PIN PLUG
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