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參數(shù)資料
| 型號(hào)： | 100364QIX |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | 16-Input Digital Multiplexer |
| 中文描述： | 100K SERIES, 16 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, PQCC28 |
| 封裝： | 0.450 X 0.450 INCH, PLASTIC, MO-047, LCC-28 |
| 文件頁(yè)數(shù)： | 5/8頁(yè) |
| 文件大小： | 124K |
| 代理商： | 100364QIX |
AC Electrical Characteristics
V
EE
= 4.2V to 5.7V, V
CC
= V
CCA
= GND
Symbol
Parameter
T
C
= 55C
Min
0.50
T
C
= 25C
Min
0.60
T
C
= +125C
Min
0.60
Units
Conditions
Notes
Max
2.60
Max
2.40
Max
2.80
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Propagation Delay
I
0
–I
15
to Output
Propagation Delay
S
0
, S
1
to Output
Propagation Delay
S
2
, S
3
to Output
Transition Time
20% to 80%, 80% to 20%
ns
Figures 1,
2
(Notes 7,
8, 9)
0.70
3.30
0.90
3.10
1.00
3.50
ns
0.50
2.90
0.70
2.60
0.60
3.00
ns
0.20
1.20
0.20
1.20
0.20
1.20
ns
(Note 10)
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25C, temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each Mfg. lot at +25C, Subgroup A9, and at +125C, and 55C temp., Subgroups A10 and A11.
Note 10:
Not tested at +25C, +125C and 55C temperature (design characterization data).
Test Circuit
DS100301-6
FIGURE 1. AC Test Circuit
www.national.com
5
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