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參數(shù)資料
| 型號： | YA868C08R-P |
| 廠商： | FUJI ELECTRIC CO LTD |
| 元件分類： | 整流器 |
| 英文描述： | 30 A, 80 V, SILICON, RECTIFIER DIODE, TO-220AB |
| 封裝： | PLASTIC, TO-220, 3 PIN |
| 文件頁數(shù)： | 8/12頁 |
| 文件大小： | 196K |
| 代理商： | YA868C08R-P |
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MS5D3286 5/12
H04-004-03a
Fuji Electric Device Technology Co.,Ltd.
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Test
No.
Test
items
Testing methods and conditions
Reference
standard
EIAJ ED4701
Sampling
number
Acceptance
number
1
High temp.
Storage
Temperature : stg max
Test duration : 1000h
EIAJ
ED4701/201
22
2
Low temp.
Storage
Temperature : stg min
Test duration : 1000h
EIAJ
ED4701/202
22
3
Temperature
humidity
storage
Temperature : 85±2°C
Relative humidity : 85±5%
Test duration : 1000h
EIAJ
ED4701/103
test code C
22
4
Temperature
humidity
bias
Temperature : 85±2°C
Relative humidity : 85±5%
Bias voltage : VRRM
Test duration : 1000h
EIAJ
ED4701/103
test code C
22
5
Unsaturated
pressurized
vapor
Temperature : 130±2°C
Relative humidity : 85±5%
Vapor pressure : 230kPa
Test duration : 48h
EIAJ
ED4701/103
test code F
22
6
Temperature
cycle
High temp. side : Tstg max
Room temp. : 5
35
Low temp. side : Tstg min
Duration time : HT 30min,RT 5min LT 30min
Number of cycles : 100 cycles
EIAJ
ED4701/105
22
7
Thermal
shock
High temp. side : 150+0/-5°C
Low temp. side : -65+5/-0°C
Duration time : HT 5min,LT 5min
Number of cycles : 200 cycles
EIAJ
ED4701/307
22
8
Steady state
operating
life
Ta=25±5°C
Rated load
Test duration : 1000h
22
9
Intermittent
operating
life
Tj=Tjmax
50
3min ON, 3min OFF
Test duration : 10000cycles
EIAJ
ED4701/106
22
Endura
n
c
e
te
s
t
10
High temp.
Reverse
bias
Temperature : Ta=100 °C
Bias voltage : VR=VRRM
Test duration : 1000h
EIAJ
ED4701/101
22
(0 : 1)
IR
USL x 2
USL : Upper specification limit
Failure criteria
VF
USL x 1.1
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