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    參數(shù)資料
    型號(hào): XC5204-5PC84I
    英文描述: Field Programmable Gate Array (FPGA)
    中文描述: 現(xiàn)場(chǎng)可編程門陣列(FPGA)
    文件頁數(shù): 19/73頁
    文件大小: 598K
    代理商: XC5204-5PC84I
    R
    November 5, 1998 (Version 5.2)
    7-101
    XC5200 Series Field Programmable Gate Arrays
    7
    Even if the boundary scan symbol is used in a schematic,
    the input pins TMS, TCK, and TDI can still be used as
    inputs to be routed to internal logic. Care must be taken not
    to force the chip into an undesired boundary scan state by
    inadvertently applying boundary scan input patterns to
    these pins. The simplest way to prevent this is to keep
    TMS High, and then apply whatever signal is desired to TDI
    and TCK.
    Avoiding Inadvertent Boundary Scan
    If TMS or TCK is used as user I/O, care must be taken to
    ensure that at least one of these pins is held constant dur-
    ing configuration. In some applications, a situation may
    occur where TMS or TCK is driven during configuration.
    This may cause the device to go into boundary scan mode
    and disrupt the configuration process.
    To prevent activation of boundary scan during configura-
    tion, do either of the following:
    TMS: Tie High to put the Test Access Port controller
    in a benign RESET state
    TCK: Tie High or Low—do not toggle this clock input.
    For more information regarding boundary scan, refer to the
    Xilinx Application Note XAPP 017, “
    Boundary Scan in
    XC4000 and XC5200 Devices
    .“
    Power Distribution
    Power for the FPGA is distributed through a grid to achieve
    high noise immunity and isolation between logic and I/O.
    Inside the FPGA, a dedicated Vcc and Ground ring sur-
    rounding the logic array provides power to the I/O drivers,
    as shown in
    Figure 21
    . An independent matrix of Vcc and
    Ground lines supplies the interior logic of the device.
    This power distribution grid provides a stable supply and
    ground for all internal logic, providing the external package
    power pins are all connected and appropriately decoupled.
    Typically, a 0.1
    μ
    F capacitor connected near the Vcc and
    Ground pins of the package will provide adequate decou-
    pling.
    Output buffers capable of driving/sinking the specified 8 mA
    loads under specified worst-case conditions may be capa-
    ble of driving/sinking up to 10 times as much current under
    best case conditions.
    Noise can be reduced by minimizing external load capaci-
    tance and reducing simultaneous output transitions in the
    same direction. It may also be beneficial to locate heavily
    loaded output buffers near the Ground pads. The I/O Block
    output buffers have a slew-rate limited mode (default)
    which should be used where output rise and fall times are
    not speed-critical.
    Pin Descriptions
    There are three types of pins in the XC5200-Series
    devices:
    Permanently dedicated pins
    User I/O pins that can have special functions
    Unrestricted user-programmable I/O pins.
    Before and during configuration, all outputs not used for the
    configuration process are 3-stated and pulled high with a
    20 k
    - 100 k
    pull-up resistor.
    After configuration, if an IOB is unused it is configured as
    an input with a 20 k
    - 100 k
    pull-up resistor.
    Device pins for XC5200-Series devices are described in
    Table 9
    . Pin functions during configuration for each of the
    seven configuration modes are summarized in
    “Pin Func-
    TDI
    TMS
    TCK
    TDO1
    TDO2
    TDO
    DRCK
    IDLE
    SEL1
    SEL2
    RESET
    UPDATE
    SHIFT
    BSCAN
    To User
    Logic
    IBUF
    Optional
    From
    User Logic
    To User
    Logic
    X9000
    Figure 20: Boundary Scan Schematic Example
    GND
    Ground and
    Vcc Ring for
    I/O Drivers
    Vcc
    GND
    Vcc
    Logic
    Power Grid
    X5422
    Figure 21: XC5200-Series Power Distribution
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