參數(shù)資料
型號: X93254
廠商: Intersil Corporation
元件分類: 數(shù)字電位計
英文描述: Dual Digitally Controlled Potentiometers
中文描述: 雙數(shù)控電位器
文件頁數(shù): 4/10頁
文件大?。?/td> 208K
代理商: X93254
4
FN8186.0
March 1, 2005
D.C. OPERATING CHARACTERISTICS
(Over recommended operating conditions unless otherwise specified.)
ENDURANCE AND DATA RETENTION
A.C. CONDITIONS OF TEST
Symbol
Parameter
Limits
Unit
Test Conditions
Min.
Typ.
(4)
Max.
I
CC1
V
CC
active current (Increment) per
DCP
50
250
μA
CS = V
IL
, U/D = V
IL
or V
IH
and
INC = 0.4V @ max. t
CY(5)
CS = V
IH
, U/D = V
IL
or V
IH
and
INC = V
IH
@ max. t
WR(5)
CS = V
CC
– 0.3V, U/D and
INC = V
SS
or V
CC
- 0.3V
V
IN
= V
CC (5)
V
CC
= 3V, CS = 0
(5)
V
IN
= V
SS
to V
CC(5)
I
CC2
V
CC
active current (Store)
(EEPROM Store) per DCP
600
μA
I
SB
Standby supply current
1
μA
I
LI
I
LI
I
LI
CS
1
or CS
2
CS
1
or CS
2
INC
1
, INC
2
, U/D
1
, U/D
2
input
leakage current
±1
μA
60
100
150
μA
±1
μA
V
IH
CS
1
, CS
2
, INC
1
, INC
2
, U/D
1
,
U/D
2
input HIGH voltage
CS
1
, CS
2
, INC
1
, INC
2
, U/D
1
,
U/D
2
input HIGH voltage
CS
1
, CS
2
, INC
1
, INC
2
, U/D
1
,
U/D
2
input capacitance
V
CC
x 0.7
V
CC
+ 0.5
V
(5)
V
IL
-0.5
V
CC
x 0.1
V
(5)
C
IN
10
pF
V
CC
= 3V, V
IN
= V
SS
,
T
A
= 25°C, f = 1MHz
(6)
Parameter
Minimum endurance
Data retention
Min.
200,000
100
Unit
Data changes per bit
Years
Input pulse levels
Input rise and fall times
Input reference levels
0V to 3V
10ns
1.5V
Test Circuit #1
Circuit #2 SPICE Macro Model
V
L
Test Point
V
H
/R
H
C
H
C
L
10pF
10pF
R
H
R
TOTAL
C
W
25pF
R
L
X93254
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