D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions unless o" />
參數(shù)資料
型號(hào): X9260US24
廠商: Intersil
文件頁(yè)數(shù): 8/23頁(yè)
文件大?。?/td> 0K
描述: IC DCP DUAL 50K 256TP 24SOIC
標(biāo)準(zhǔn)包裝: 30
系列: XDCP™
接片: 256
電阻(歐姆): 50k
電路數(shù): 2
溫度系數(shù): 標(biāo)準(zhǔn)值 ±300 ppm/°C
存儲(chǔ)器類型: 非易失
接口: 6 線 SPI(芯片選擇,設(shè)備位址)
電源電壓: 4.5 V ~ 5.5 V
工作溫度: 0°C ~ 70°C
安裝類型: 表面貼裝
封裝/外殼: 24-SOIC(0.295",7.50mm 寬)
供應(yīng)商設(shè)備封裝: 24-SOIC
包裝: 管件
16
FN8170.3
August 29, 2006
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
ENDURANCE AND DATA RETENTION
CAPACITANCE
POWER-UP TIMING
POWER-UP AND DOWN REQUIREMENTS
The are no restrictions on the sequencing of the bias supplies VCC, V+, and V- provided that all three supplies reach
their final values within 1msec of each other. At all times, the voltages on the potentiometer pins must be less than V+
and more than V-. The recall of the wiper position from nonvolatile memory is not in effect until all supplies reach their
final value. The VCC ramp rate spec is always in effect.
A.C. TEST CONDITIONS
Notes: (6) This parameter is not 100% tested
(7) tPUR and tPUW are the delays required from the time the (last) power supply (VCC-) is stable until the specific instruction can be issued.
These parameters are not 100% tested.
Symbol
Parameter
Limits
Test Conditions
Min.
Typ.
Max.
Units
ICC1
VCC supply current
(active)
400
μAfSCK = 2.5 MHz, SO = Open, VCC = 6V
Other Inputs = VSS
ICC2
VCC supply current
(nonvolatile write)
15
mA
fSCK = 2.5MHz, SO = Open, VCC = 6V
Other Inputs = VSS
ISB
VCC current (standby)
5
μASCK = SI = VSS, Addr. = VSS,
CS = VCC = 6V
ILI
Input leakage current
10
μAVIN = VSS to VCC
ILO
Output leakage current
10
μAVOUT = VSS to VCC
VIH
Input HIGH voltage
VCC x 0.7
VCC + 1
V
VIL
Input LOW voltage
-1
VCC x 0.3
V
VOL
Output LOW voltage
0.4
V
IOL = 3mA
VOH
Output HIGH voltage
VCC - 0.8
V
IOH = -1mA, VCC ≥ +3V
VOH
Output HIGH voltage
VCC - 0.4
V
IOH = -0.4mA, VCC ≤ +3V
Parameter
Min.
Units
Minimum endurance
100,000
Data changes per bit per register
Data retention
100
years
Symbol
Test
Max.
Units
Test Conditions
COUT(6)
Output capacitance (SO)
8
pF
VOUT = 0V
CIN(6)
Input capacitance (A0, A1, SI, CS, WP, HOLD, and SCK)
6
pF
VIN = 0V
Symbol
Parameter
Min.
Max.
Units
tr VCC(6)
VCC Power-up rate
0.2
50
V/ms
tPUR(7)
Power-up to initiation of read operation
1
ms
I
nput Pulse Levels
VCC x 0.1 to VCC x 0.9
Input rise and fall times
10ns
Input and output timing level
VCC x 0.5
X9260
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