參數(shù)資料
型號: X84041SI2.7
英文描述: Serial EEPROM
中文描述: 串行EEPROM
文件頁數(shù): 6/13頁
文件大?。?/td> 137K
代理商: X84041SI2.7
X84041
Characteristics subject to change without notice.
6 of 13
REV 1.0 6/29/00
www.xicor.com
D.C. OPERATING CHARACTERISTICS (V
CC
= 3V ±10%)
(Over the recommended operating conditions, unless otherwise specified.)
Note:
(1) V
IL
min. and V
IH
max. are for reference only and are not tested.
CAPACITANCE
T
A
= +25°C, f = 1MHz, V
CC
= 5V
POWER-UP TIMING
Note:
(3) Time delays required from the time the V
tested.
CC
is stable until the specific operation can be initiated. Periodically sampled, but not 100%
Symbol
I
CC1
Parameter
supply current (read)
Limits
Unit
μA
Test Conditions
, WE = V
IH
, I/O = Open, CE clocking
@ 2MHz
I
CC
during nonvolatile write cycle All inputs at
CMOS levels
CE = V
CC
, Other inputs = V
CC
or V
SS
,
V
CC
= 3V ±10%
V
IN
= V
SS
to V
CC
V
OUT
= V
SS
to V
CC
Min.
Max.
250
V
CC
OE = V
IL
I
CC2
V
CC
supply current (write)
1
mA
I
SB1
V
CC
standby current
10
μA
I
LI
I
LO
V
lL
(1)
V
IH
(1)
V
OL
V
OH
Input leakage current
Output leakage current
Input low voltage
Input high voltage
Output low voltage
Output high voltage
10
10
μA
μA
V
V
V
V
–1
V
CC
x 0.3
V
CC
+ 0.5
0.4
V
CC
x 0.7
I
OL
= 1mA, V
CC
= 3V ±10%
I
OH
= –400μA, V
CC
= 3V ±10%
V
CC
– 0.4
Symbol
C
I/O
(2)
C
IN
(2)
Parameter
Max.
8
6
Unit
pF
pF
Test Conditions
V
I/O
= 0V
V
IN
= 0V
Input/Output capacitance
Input capacitance
Symbol
t
PUR
(3)
t
PUW
(3)
Parameter
Max.
2
5
Unit
ms
ms
Power-up to read operation
Power-up to write operation
A.C. CONDITIONS OF TEST
EQUIVALENT A.C. LOAD CIRCUITS
Input pulse levels
Input rise and fall times
Input and output timing levels
V
CC
x 0.1 to V
CC
x 0.9
5ns
V
CC
x 0.5
5V
30pF
2.06K
3.03K
Output
3V
30pF
2.39K
4.58K
Output
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