
X24320
11
Temperature under Bias
X24320
....................................... –65
°
C to +135
°
C
Storage Temperature ........................ –65
°
C to +150
°
C
Voltage on any Pin with
Respect to V
SS
.................................... –1V to +7V
D.C. Output Current .............................................. 5mA
Lead Temperature (Soldering,
10 seconds)
.............................. 300
°
C
D.C. OPERATING CHARACTERISTICS
7003 FRM T06
CAPACITANCE
T
A
= +25
°
C, f = 1MHz, V
CC
= 5V
7003 FRM T07
Notes:
(1)Must perform a stop command prior to measurement.
(2)V
IL
min. and V
IH
max. are for reference only and are not 100% tested. (3)This
parameter is periodically sampled and not 100% tested.
Limits
Symbol
Parameter
Min.
Max.
Units
Test Conditions
I
CC1
V
CC
Supply Current (Read)
1
mA
SCL = V
CC
X 0.1/V
CC
X 0.9 Levels @
400KHz, SDA = Open, All Other
Inputs =
V
SS
or V
CC
– 0.3V
I
CC2
V
CC
Supply Current (Write)
3
mA
I
SB1
(1)
V
CC
Standby Current
5
∝
A
SCL = SDA = V
CC
, All Other
Inputs =
V
SS
or V
CC
– 0.3V,
V
CC
= 5V
±
10%
I
SB2
(1)
V
CC
Standby Current
1
∝
A
SCL = SDA = V
CC
, All Other
Inputs =
V
SS
or V
CC
– 0.3V,
V
CC
= 2.5V
I
LI
Input Leakage Current
10
∝
A
V
IN
=
V
SS
to V
CC
I
LO
Output Leakage Current
10
∝
A
V
OUT
=
V
SS
to V
CC
V
lL
(2)
Input LOW Voltage
–0.5
V
CC
x 0.3
V
V
IH
(2)
Input HIGH Voltage
V
CC
x 0.7
V
CC
+ 0.5
V
V
OL
Output LOW Voltage
0.4
V
I
OL
= 3mA
V
hys
(3)
Hysteresis of Schmitt
Trigger Inputs
V
CC
x 0.05
V
Symbol
Parameter
Max.
Units
Test Conditions
C
I/O
(3)
Input/Output Capacitance (SDA)
8
pF
V
I/O
= 0V
C
IN
(3)
Input Capacitance (S
0
, S
1
, S
2
, SCL, WP)
6
pF
V
IN
= 0V
RECOMMENDED OPERATING CONDITIONS
7003 FRM T04
Temperature
Min.
Max.
Commercial
0
°
C
+70
°
C
Industrial
–40
°
C
+85
°
C
7003 FRM T05
Supply Voltage
Limits
X24320
4.5V to 5.5V
X24320–2.
5
8
2.5V to 5.5V
1.8V to 3.6V
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This
is a stress rating only and the functional operation
of the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.