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參數(shù)資料
| 型號： | WS1M32-20H2MA |
| 廠商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分類： | SRAM |
| 英文描述： | 1M X 32 MULTI DEVICE SRAM MODULE, 20 ns, CPGA66 |
| 封裝： | 1.385 X 1.385 INCH, HERMETIC SEALED, CERAMIC, HIP-66 |
| 文件頁數(shù)： | 3/7頁 |
| 文件大?。?/td> | 479K |
| 代理商： | WS1M32-20H2MA |
WS1M32-XH2X
3
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
White Electronic Designs
White Electronic Designs Corp. reserves the right to change products or specications without notice.
March 2009
Rev. 8
Parameter
Symbol
-20
-25
Units
Read Cycle
Min
Max
Min
Max
Read Cycle Time
tRC
20
25
ns
Address Access Time
tAA
20
25
ns
Output Hold from Address Change
tOH
00
ns
Chip Select Access Time
tACS
20
25
ns
Output Enable to Output Valid
tOE
88
ns
Chip Select to Output in Low Z
tCLZ1
22
ns
Output Enable to Output in Low Z
tOLZ1
00
ns
Chip Disable to Output in High Z
tCHZ1
88
ns
Output Disable to Output in High Z
tOHZ1
88
ns
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
(VCC = 5.0V, GND = 0V, TA = -55°C to +125°C)
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC CHARACTERISTICS
(VCC = 5.0V, GND = 0V, TA = -55°C to +125°C)
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Parameter
Symbol
-20
-25
Units
Write Cycle
Min
Max
Min
Max
Write Cycle Time
tWC
20
25
ns
Chip Select to End of Write
tCW
12
ns
Address Valid to End of Write
tAW
10
ns
Data Valid to End of Write
tDW
10
ns
Write Pulse Width
tWP
12
ns
Address Setup Time
tAS
00
ns
Address Hold Time
tAH
00
ns
Output Active from End of Write
tOW1
34
ns
Write Enable to Output in High Z
tWHZ1
11
13
ns
Data Hold Time
tDH
00
ns
1.This parameter is guaranteed by design but not tested.
AC TEST CIRCUIT
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