參數(shù)資料
型號: WF512K32N-90G2LQ5
英文描述: 512Kx32 5V FLASH MODULE, SMD 5962-94612
中文描述: 512Kx32 5V的閃存盤,貼片5962-94612
文件頁數(shù): 4/16頁
文件大小: 514K
代理商: WF512K32N-90G2LQ5
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WF512K32-XXX5
March 2006
Rev. 11
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS# CONTROLLED
V
CC
= 5.0V, GND = 0V, -55°C
T
A
+125°C
Parameter
Symbol
-60
-70
-90
-120
-150
Unit
Min
60
0
40
0
40
0
40
20
Max
Min
70
0
45
0
45
0
45
20
Max
Min
90
0
45
0
45
0
45
20
Max
Min
120
0
50
0
50
0
50
20
Max
Min
150
0
50
0
50
0
50
20
Max
Write Cycle Time
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Chip Select Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase Time (2)
Read Recovery Time
Chip Programming Time
Chip Erase Time (3)
t
AVAV
t
WLEL
t
ELEH
t
AVEL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
ns
ns
ns
ns
ns
ns
ns
ns
μs
sec
ns
sec
sec
300
15
300
15
300
15
300
15
300
15
0
0
0
0
0
11
64
11
64
11
64
11
64
11
64
NOTES:
1. Typical value for t
WHWH1
is 7μs.
2. Typical value for t
WHWH2
is 1sec.
3. Typical value for Chip Erase Time is 8sec.
I
Current Source
D.U.T.
C = 50 pf
I
OL
V
1.5V
(Bipolar Supply)
Current Source
OH
FIGURE. 4 – AC TEST CIRCUIT
Notes:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75
.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC Test Conditions
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
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