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參數(shù)資料
| 型號： | WF512K32-150G4M5 |
| 廠商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分類： | PROM |
| 英文描述： | 512K X 32 FLASH 5V PROM MODULE, 150 ns, CQFP68 |
| 封裝： | 40 MM, CERAMIC, LQFP-68 |
| 文件頁數(shù)： | 11/16頁 |
| 文件大小： | 355K |
| 代理商： | WF512K32-150G4M5 |
4
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
WF512K32-XXX5
White Electronic Designs
Parameter
Symbol
-60
-70
-90
-120
-150
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tAVAV
tWC
60
70
90
120
150
ns
Write Enable Setup Time
tWLEL
tWS
00
0
ns
Chip Select Pulse Width
tELEH
tCP
40
45
50
ns
Address Setup Time
tAVEL
tAS
00
0
ns
Data Setup Time
tDVEH
tDS
40
45
50
ns
Data Hold Time
tEHDX
tDH
00
0
ns
Address Hold Time
tELAX
tAH
40
45
50
ns
Chip Select Pulse Width High
tEHEL
tCPH
20
ns
Duration of Byte Programming Operation (1)
t WHWH1
300
s
Sector Erase Time (2)
t WHWH2
15
sec
Read Recovery Time
tGHEL
00
0
ns
Chip Programming Time
11
sec
Chip Erase Time (3)
64
sec
AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS,CS CONTROLLED
(VCC = 5.0V, VSS = 0V, TA = -55°C TO +125°C)
FIG. 4 AC TEST CIRCUIT
AC TEST CONDITIONS
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
NOTES:
1. Typical value for tWHWH1 is 7s.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 8sec.
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| WF512K32-150G4TC5 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:EEPROM|FLASH|512KX32|HYBRID|QFL|68PIN|CERAMIC |
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| WF512K32-150G4TI5 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:EEPROM|FLASH|512KX32|HYBRID|QFL|68PIN|CERAMIC |
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| WF512K32-150G4TM5 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:EEPROM|FLASH|512KX32|HYBRID|QFL|68PIN|CERAMIC |
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