參數(shù)資料
型號(hào): WF4M32-150H2M5
英文描述: 4Mx32 5V FLASH MODULE
中文描述: 4Mx32 5V的閃存模塊
文件頁(yè)數(shù): 7/15頁(yè)
文件大?。?/td> 456K
代理商: WF4M32-150H2M5
7
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
PRELIMINARY
June 2004
Rev. 6
AC CHARACTERISTICS FOR G4T AND H2 PACKAGES – WRITE/ERASE/PROGRAM
OPERATIONS,CS# CONTROLLED
V
CC
= 5.0V, GND = 0V, -55°C
T
A
+125°C
AC Test Conditions
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH
are adjusted to simulate a typical resistive load cir cuit.
ATE tester includes jig capacitance.
NOTES:
1. A21 must be held constant until WE# or CS# go high, whichever occurs first.
2. Typical value for t
WHWH1
is 7μs.
3. Typical value for t
is 1sec.
4. Typical value for Chip Erase Time is 32sec.
5. For Toggle and Data Polling.
Current Source
D.U.T.
C
EFF
= 50 pf
I
OL
I
OH
V
Z
≈ 1.5V
(Bipolar Supply)
Current Source
RESET#
t
RP
t
Ready
Parameter
Symbol
-100
-120
-150
Unit
Min
100
0
45
0
45
15
45
20
Max
Min
120
0
50
0
50
15
50
20
Max
Min
150
0
50
0
50
15
50
20
Max
Write Cycle Time
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time (1)
Chip Select Pulse Width High
Duration of Byte Programming Operation (2)
Sector Erase Time (3)
Read Recovery Time
Chip Programming Time
Chip Erase Time (4)
Output Enable Hold Time (5)
t
AVAV
t
WLEL
t
ELEH
t
AVEL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
ns
ns
ns
ns
ns
ns
ns
ns
μs
sec
μs
sec
sec
ns
300
15
300
15
300
15
0
0
0
44
256
44
256
44
256
t
OEH
10
10
10
FIGURE 4 – AC TEST CIRCUIT
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
V
ns
V
V
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
FIGURE 5 – RESET TIMING DIAGRAM
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