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參數(shù)資料
| 型號： | WED8LM32129V-35EITA |
| 元件分類： | SRAM |
| 英文描述： | 128K X 32 MULTI DEVICE SRAM MODULE, 35 ns, CQMA68 |
| 封裝： | CERAMIC, LQFP-68 |
| 文件頁數(shù)： | 3/6頁 |
| 文件大?。?/td> | 117K |
| 代理商： | WED8LM32129V-35EITA |
3
White Electronic Designs Corporation Phoenix, AZ (602) 437-1520
WED8LM32129V
FIG. 2
AC TEST CIRCUIT
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
≈ 1.5V
(Bipolar Supply)
Z
Current Source
OH
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
AC CHARACTERISTICS
(VCC = 3.3V, TA = -55
°C to +125°C)
Parameter
Symbol
-15*
-17
-20
-25
-35
Units
Read Cycle
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Read Cycle Time
tRC
15
17
20
25
35
ns
Address Access Time
tAA
15
17
20
25
35
ns
Output Hold from Address Change
tOH
0
000
0
ns
Chip Select Access Time
tACS
15
17
20
25
35
ns
Output Enable to Output Valid
tOE
10
11
12
15
20
ns
Chip Select to Output in Low Z
tCLZ1
5
555
5
ns
Output Enable to Output in Low Z
tOLZ1
5
555
5
ns
Chip Disable to Output in High Z
tCHZ1
8
9
10
12
15
ns
Output Disable to Output in High Z
tOHZ1
8
9
10
12
15
ns
1. This parameter is guaranteed by design but not tested.
* Commercial and Industrial only.
AC CHARACTERISTICS
(VCC = 3.3V, TA = -55
°C to +125°C)
Parameter
Symbol
-15*
-17
-20
-25
-35
Units
Write Cycle
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Write Cycle Time
tWC
15
17
20
25
35
ns
Chip Select to End of Write
tCW
13
14
15
20
30
ns
Address Valid to End of Write
tAW
13
14
15
20
30
ns
Data Valid to End of Write
tDW
10
11
12
15
18
ns
Write Pulse Width
tWP
13
14
15
20
30
ns
Address Setup Time
tAS
00
0
ns
Address Hold Time
tAH
00
0
ns
Output Active from End of Write
tOW1
55
5
ns
Write Enable to Output in High Z
tWHZ1
8
9
10
15
ns
Data Hold Time
tDH
00
0
ns
1. This parameter is guaranteed by design but not tested.
* Commercial and Industrial only.
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