參數(shù)資料
型號(hào)： W78E354
廠(chǎng)商： WINBOND ELECTRONICS CORP
元件分類(lèi)： 微控制器/微處理器
英文描述： MONITOR MICROCONTROLLER
中文描述： 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PDIP40
封裝： DIP-40
文件頁(yè)數(shù)： 35/45頁(yè)
文件大?。?/td> 430K
代理商： W78E354
W78E354
Publication Release Date: April 1997
- 35 -
Revision A1
8. Proram/Erase Inhibit
This operation allows parallel erasing or programming of multiple chips with different data.
9. Mass Program
In order to increase the throughput of testing, this operation programs 256 bytes with the same data
simultaneously. Note that 256 program verify operations must follow each mass program operation.
All the timings for this operation are the same as those of the byte program operation except that the
/CE program pulse width is 125
μ
S. In addition, this operation is also used for cell reliability analysis
by stressing the source line.
10. Read Company ID and Device ID
These two modes are especially useful in EPROM WRITERs, which can read the silicon identification
to set the appropriate erase or program algorithm to match the device being erased or programmed.
11. VT
This operation is used for cell performance analysis. By connecting 2V to the D7..D0 pins, the cell
currents can be measured for each location within the chip by specifying its appropriate address.
12. Read ROM-map Bits
This operation is used to verify the ROM-MAP bits which were programmed previously. Its action is
the same as an EEPROM read operation.
13. Fuse ROM-map Bits
The ROM-MAP bits can be fused by this operation only. Its action is the same as an EEPROM
program operation.
14. Erase ROM-map Bits
The ROM-MAP bits can be erased by this operation only. Its action is the same as an EEPROM erase
operation.
15. CKBD & /CKBD Mass Program
These two operations are used to mass program the Flash cells in such a way that the state of any bit
is different from those of its neighboring bits.
16. Read Disturb
B. Test Mode
*RAM-test Mode
This mode is used to verify the function of the internal 512 bytes of RAM by a write-in and then read-
out operation.
*Functional Test Mode
If the
EA
(TestCLK) pin is pulled low when the chip is being reset and remains low for at least 24
clock periods after the reset, the CPU will execute from the external program memory (maximum
program size is 2K bytes). This feature may be used to test the chip's functions via an external
program. It should be noted that this mode is like the normal operation except that the CPU executes
from external program memory and that some different pins are used in place of A10
A0, D7
D0 and
PSEN
instead of their original functions.
相關(guān)PDF資料
PDF描述
W78E354P MONITOR MICROCONTROLLER
W78E51BP-24 8-BIT MTP MICROCONTROLLER
W78E51B-24 8-BIT MTP MICROCONTROLLER
W78E51B-40 8-BIT MTP MICROCONTROLLER
W78E51B 8-BIT MTP Monitor Microcontroller(多次可編程的8位的監(jiān)視微控制器)
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
W78E354P 制造商:WINBOND 制造商全稱(chēng):Winbond 功能描述:MONITOR MICROCONTROLLER
W78E365 制造商:未知廠(chǎng)家 制造商全稱(chēng):未知廠(chǎng)家 功能描述:8-bit microcontroller
W78E365_07 制造商:WINBOND 制造商全稱(chēng):Winbond 功能描述:8-BIT MICROCONTROLLER
W78E365-24 制造商:未知廠(chǎng)家 制造商全稱(chēng):未知廠(chǎng)家 功能描述:Microcontroller
W78E365-40 制造商:未知廠(chǎng)家 制造商全稱(chēng):未知廠(chǎng)家 功能描述:Microcontroller
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