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參數(shù)資料
| 型號(hào)： | VSC6250QW |
| 廠商： | Vitesse Semiconductor Corporation. |
| 英文描述： | 1Gb/s 16-Channel Drive-Side Deskew IC |
| 中文描述： | 1GB / s的16通道驅(qū)動(dòng)器側(cè)偏移校正集成電路 |
| 文件頁數(shù)： | 1/18頁 |
| 文件大?。?/td> | 240K |
| 代理商： | VSC6250QW |
G52197-0, Rev. 4.0
8/19/00
VITESSE
SEMICONDUCTOR CORPORATION
741 Calle Plano, Camarillo, CA 93012 805/388-3700 FAX: 805/987-5896
Page 1
VITESSE
Data Sheet
VSC6250
1Gb/s 16-Channel
Drive-Side Deskew IC
Features
Applications
General Description
The VSC6250 is intended for use in the next generation of high-speed, high-accuracy memory testers for
devices such as Direct RAMBUS DRAM, SLDRAM, DDR SDRAM, and fast SSRAM.
The VSC6250 provides ultra-precise timing to allow next generation memory testers to achieve excellent
overall timing accuracy. Timing delays of the VSC6250 are extremely stable with respect to temperature and
voltage. Proprietary circuit design and process technology reduce pattern, data, frequency, and duty-cycle
dependencies to an absolute minimum. The VSC6250 requires no external DACs, which eliminates errors due
to DAC reference noise and analog crosstalk, and DAC temperature and voltage drift. The VSC6250 is avail-
able in a 128-pin PQFP, 14x20mm thermally-enhanced package.
Wide Span: > 4ns Usable Range
Pulse Width Adjustment to Compensate for
Dispersion in Pin Electronics:
± 2ns Independent Adjustment of Rising and
Falling Edges
Fully Digital Single-Chip Solution:
No Off-Chip DACs Required
No DAC-Induced Timing Errors from Analog
Crosstalk, Reference Noise, Temperature, or
Voltage Drift
Single Power Supply: -2V @ 5W
128-Pin PQFP, 14x20mm Thermally-
Enhanced Package
High-Speed Operation:
1 Gb/s Data Rate
500ps min Output Pulse Width
750ps min Input Pulse Width
Excellent Overall Timing Accuracy:
Ultra-Stable Timing Delays
Minimum Pattern Dependence
Very Fine Timing Resolution (1 LSB = 8ps)
High Level of Integration Reduces Board Area:
16 Independently Adjustable Delay Lines in a
Single Package
Configurable as 2 1:8 or 1:16
High-Speed Instrumentation: Pulse Generators,
Timing Margin Testers for Datalink, Interface,
and Disk Drive Applications
Telecom, Datacom, and Computer Deskew
Drive-Side Deskew in High-Speed Memory
Testers
Direct RAMBUS DRAM, SLDRAM, DDR
SDRAM, Fast SSRAM
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