參數(shù)資料
型號(hào): TPS7325Y
廠商: Texas Instruments, Inc.
元件分類: 基準(zhǔn)電壓源/電流源
英文描述: LOW-DROPOUT VOLTAGE REGULATORS WITH INTEGRATED DELAYED RESET FUNCTION
中文描述: 低技術(shù),集成延遲復(fù)位功能降穩(wěn)壓器
文件頁(yè)數(shù): 10/43頁(yè)
文件大小: 638K
代理商: TPS7325Y
TPS7301Q, TPS7325Q, TPS7330Q, TPS7333Q, TPS7348Q, TPS7350Q
LOW-DROPOUT VOLTAGE REGULATORS
WITH INTEGRATED DELAYED RESET FUNCTION
SLVS124F – JUNE 1995 – REVISED JANUARY 1999
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
TPS7330Q electrical characteristics at I
O
= 10 mA, V
I
= 4 V, EN = 0 V, C
o
= 4.7
μ
F (CSR
= 1
), SENSE
shorted to OUT (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
25
°
C
MIN
TYP
MAX
UNIT
Output voltage
3
V
4 V
VI
10 V,
5 mA
IO
500 mA
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
2.94
3.06
IO= 10 mA
IO = 10 mA,
VI= 2 94 V
VI = 2.94 V
5.2
7
10
Dropout voltage
IO= 100 mA
IO = 100 mA,
VI= 2 94 V
VI = 2.94 V
52
75
mV
100
IO= 500 mA
IO = 500 mA,
VI= 2 94 V
VI = 2.94 V
267
450
500
Pass element series resistance
Pass-element series resistance
(2.94 V – VO)O,
IO = 500 mA
VI = 2.94 V,
0.5
0.7
1
Input regulation
VI= 4 V to 10 V
VI = 4 V to 10 V,
μ
50
A
IO
500 mA
6
23
mV
29
IO= 5 mA to 500 mA
IO = 5 mA to 500 mA,
4 V
VI
10 V
20
32
mV
Output regulation
60
IO= 50
μ
IO = 50
A to 500 mA,
4 V
VI
10 V
28
60
mV
120
IO= 50
μ
IO = 50
A
43
53
Ripple rejection
f = 120 Hz
40
dB
IO= 500 mA
IO = 500 mA
39
53
36
Output noise-spectral density
f = 120 Hz
2
μ
V/
Hz
Co = 4.7
μ
F
Co = 10
μ
F
Co = 100
μ
F
25
°
C
25
°
C
25
°
C
274
Output noise voltage
10 Hz
f
100 kHz
228
μ
Vrms
159
RESET trip-threshold voltage
VO decreasing
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
2.58
2.64
2.7
V
RESET output low voltage
VI= 2 6 V
VI = 2.6 V,
IO(RESET)=
IO(RESET) = –0.8 mA
0 8 mA
0.14
0.4
0.4
V
CSR refers to the total series resistance, including the ESR of the capacitor, any series resistance added externally, and PWB trace resistance
to Co.
Pulse-testing techniques are used to maintain virtual junction temperature as close as possible to ambient temperature; thermal effects must
be taken into account separately.
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