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參數(shù)資料
| 型號： | TPS7133Y |
| 廠商： | Texas Instruments, Inc. |
| 元件分類： | 基準(zhǔn)電壓源/電流源 |
| 英文描述： | LOW-DROPOUT VOLTAGE REGULATORS |
| 中文描述： | 低壓差電壓調(diào)節(jié)器 |
| 文件頁數(shù)： | 6/33頁 |
| 文件大小： | 541K |
| 代理商： | TPS7133Y |
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TPS7101Q, TPS7133Q, TPS7148Q, TPS7150Q
TPS7101Y, TPS7133Y, TPS7148Y, TPS7150Y
LOW-DROPOUT VOLTAGE REGULATORS
SLVS092F – NOVEMBER 1994 – REVISED JANUARY 1997
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics at I
O
= 10 mA, EN = 0 V, C
O
= 4.7
μ
F/CSR
= 1
, SENSE/FB shorted to OUT
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
TJ
TPS7101Q, TPS7133Q
TPS7148Q, TPS7150Q
MIN
TYP
285
UNIT
MAX
350
Ground current (active mode)
EN
≤
0.5 V,
0 mA
≤
IO
≤
500 mA
VI = VO + 1 V,
VI VO + 1 V,
25
°
C
μ
A
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
–40
°
C to 125
°
C
460
Input current (standby mode)
EN = VI,
2 7 V
≤
≤
2.7 V
VI
10 V
0.5
μ
A
2
Output current limit
VO= 0
VO = 0,
VI= 10 V
VI = 10 V
1.2
2
A
2
Pass-element leakage current in standby
mode
EN = VI,
2 7 V
≤
≤
2.7 V
VI
10 V
0.5
μ
A
1
PG leakage current
Normal operation,
VPG= 10 V
VPG = 10 V
0.02
0.5
μ
A
0.5
Output voltage temperature coefficient
61
75
ppm/
°
C
°
C
Thermal shutdown junction temperature
165
EN logic high (standby mode)
2.5 V
≤
VI
≤
6 V
6 V
≤
VI
≤
10 V
–40
°
C to 125
°
C
2
V
2.7
EN logic low (active mode)
2 7 V
≤
2.7 V
VI
≤
10 V
25
°
C
0.5
V
–40
°
C to 125
°
C
25
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
25
°
C
–40
°
C to 125
°
C
0.5
EN hysteresis voltage
50
mV
EN input current
≤
0 V
VI
≤
10 V
≤
0 V
VI
≤
10 V
–0.5
0.5
μ
A
–0.5
0.5
Minimum VIfor active pass element
Minimum VI for active pass element
2.05
2.5
V
2.5
Minimum VIfor valid PG
Minimum VI for valid PG
IPG= 300
μ
IPG = 300
A
IPG= 300
μ
IPG = 300
A
1.06
1.5
1.9
V
CSR (compensation series resistance) refers to the total series resistance, including the equivalent series resistance (ESR) of the capacitor, any
series resistance added externally, and PWB trace resistance to CO.
Pulse-testing techniques are used to maintain virtual junction temperature as close as possible to ambient temperature; thermal effects must
be taken into account separately.
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