參數(shù)資料
型號: TP30
英文描述: TRISIL
中文描述: 的TRISIL
文件頁數(shù): 4/6頁
文件大?。?/td> 153K
代理商: TP30
TP30-xxx Series
4/6
TEST CIRCUIT 2 for I
H
parameter.
R
- V
P
V
BAT
= - 48 V
Surge generator
D.U.T.
This is a GO-NOGO Test which allows to confirm the holding current (I
H
) level in a functional
test circuit.
TEST PROCEDURE :
n
1) Adjust the current level at the I
H
value by short circuiting the AK of the D.U.T.
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000
μ
s.
3) The D.U.T will come back off-state within 50 ms max.
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