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參數(shù)資料
| 型號： | TMS320C6202BGGP167 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Aluminum Electrolytic Radial Lead High Ripple High Reliability Capacitor; Capacitance: 330uF; Voltage: 25V; Case Size: 10x12.5 mm; Packaging: Bulk |
| 中文描述： | 定點(diǎn)數(shù)字信號處理器 |
| 文件頁數(shù)： | 112/123頁 |
| 文件大?。?/td> | 1205K |
| 代理商： | TMS320C6202BGGP167 |
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6.9.7.3
Sequential Sampling Mode (Single-Channel) (SMODE = 0)
Analog Input on
Channel Ax or Bx
ADC Clock
Sample and Hold
SH Pulse
SMODE Bit
t
dschx_n
t
dschx_n+1
Sample n
Sample n+1
Sample n+2
t
SH
ADC Event Trigger from
ePWM or Other Sources
t
d(SH)
TMS320F2808, TMS320F2806
TMS320F2801, UCD9501
Digital Signal Processors
SPRS230F–OCTOBER 2003–REVISED SEPTEMBER 2005
In sequential sampling mode, the ADC can continuously convert input signals on any of the channels (Ax
to Bx). The ADC can start conversions on event triggers from the ePWM, software trigger, or from an
external ADCSOC signal. If the SMODE bit is 0, the ADC will do conversions on the selected channel on
every Sample/Hold pulse. The conversion time and latency of the Result register update are explained
below. The ADC interrupt flags are set a few SYSCLKOUT cycles after the Result register update. The
selected channels will be sampled at every falling edge of the Sample/Hold pulse. The Sample/Hold pulse
width can be programmed to be 1 ADC clock wide (minimum) or 16 ADC clocks wide (maximum).
Figure 6-23. Sequential Sampling Mode (Single-Channel) Timing
Table 6-39. Sequential Sampling Mode Timing
SAMPLE n
SAMPLE n + 1
AT 12.5 MHz
ADC CLOCK,
t
c(ADCCLK)
= 80 nS
REMARKS
t
d(SH)
Delay time from event trigger to
sampling
Sample/Hold width/Acquisition
Width
Delay time for first result to appear
in Result register
Delay time for successive results to
appear in Result register
2.5t
c(ADCCLK)
t
SH
(1 + Acqps) *
t
c(ADCCLK)
4t
c(ADCCLK)
80 ns with Acqps = 0
Acqps value = 0-15
ADCTRL1[8:11]
t
d(schx_n)
320 ns
t
d(schx_n+1)
(2 + Acqps) *
t
c(ADCCLK)
160 ns
112
Electrical Specifications
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