參數(shù)資料
型號(hào): TLC1541DW
廠(chǎng)商: Texas Instruments, Inc.
英文描述: 10-BIT ANALOG-TO-DIGITAL CONVERTER WITH SERIAL CONTROL AND 11 INPUTS
中文描述: 10位模擬到數(shù)字與串行控制和11轉(zhuǎn)換器輸入
文件頁(yè)數(shù): 3/11頁(yè)
文件大小: 161K
代理商: TLC1541DW
TLC1541
10-BIT ANALOG-TO-DIGITAL CONVERTER
WITH SERIAL CONTROL AND 11 INPUTS
SLAS073C – DECEMBER 1995 – REVISED AUGUST 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
operating sequence
MSB
LSB
Don’t Care
Don’t Care
MSB
LSB
twH(CS)
tconv
See Note A
See Note C
HI-Z
State
HI-Z State
Sample
Cycle C
Access
Cycle C
Sample
Cycle B
Access
Cycle B
Previous Conversion Data A
Conversion Data B
A9
B9
MSB
LSB MSB
MSB
LSB MSB
(see Note B)
B9
B8
B7
B6
B5 B4
B3
B2
B1
B0
A9
A8
A7
A6 A5
A4
A3
A2
A1
A0
B3
B2 B1
B0
C3
C2 C1
C0
Don’t Care
1
2
3
4
5
6
7
8
9
10
1
2
3
4
5
6
7
8
9
10
I/O
CLOCK
ADDRESS
INPUT
DATA
OUT
CS
NOTES: A. The conversion cycle, which requires 44 system clock periods, initiates on the tenth falling edge of the I/O clock after CS goes low
for the channel whose address exists in memory at that time. When CS is kept low during conversion, the I/O clock must remain
low for at least 44 system clock cycles to allow the conversion to complete.
B. The most significant bit (MSB) is automatically placed on the DATA OUT bus after CS is brought low. The remaining nine bits (A8–A0)
clock out on the first nine I/O clock falling edges.
C. To minimize errors caused by noise at the CS input, the internal circuitry waits for three system clock cycles (or less) after a
chip-select falling edge is detected before responding to control input signals. Therefore, no attempt should be made to clock-in
address data until the minimum chip-select setup time elapses.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
CC
(see Note 1)
Input voltage range, V
I
(any input)
Output voltage range, V
O
Peak input current (any input)
Peak total input current (all inputs)
Operating free-air temperature range, T
A
: C suffix
6.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I suffix
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Case temperature for 10 seconds, T
C
: FN package
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds: DW or N package
–0.3 V to V
CC
+ 0.3 V
–0.3 V to V
CC
+ 0.3 V
±
10 mA
±
30 mA
0
°
C to 70
°
C
–40
°
C to 85
°
C
–65
°
C to 150
°
C
260
°
C
260
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to digital ground with REF– and GND wired together (unless otherwise noted).
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