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參數(shù)資料
| 型號： | TL284xD-8 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | CURRENT-MODE PWM CONTROLLERS |
| 中文描述： | 電流模式PWM控制器 |
| 文件頁數(shù)： | 10/12頁 |
| 文件大?。?/td> | 171K |
| 代理商： | TL284XD-8 |
TL284x, TL384x
CURRENT-MODE PWMCONTROLLERS
SLVS038E – JANUARY 1989 – REVISED DECEMBER 1999
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
APPLICATION INFORMATION
DEAD TIME
vs
TIMING CAPACITANCE
Figure 4
s
μ
D
100
40
10
4
0
CT – Timing Capacitance – nF
100
40
10
4
1
0.4
0.1
VCC = 15 V
RT
≥
5 k
TA = 25
°
C
TIMING RESISTANCE
vs
FREQUENCY
Figure 5
R
T
–
100
1 k
10 k
100 k
1 M
f - Frequency - Hz
100
40
10
4
1
VCC = 15 V
TA = 25
°
C
CT = 22 nF
CT = 47 nF
CT = 100 nF
CT = 10 nF
CT = 4.7 nF
CT = 22 nF
CT = 1 nF
open-loop laboratory test fixture
In the open-loop laboratory test fixture shown in Figure 6, high peak currents associated with loads necessitate
careful grounding techniques. Timing and bypass capacitors should be connected close to the GND terminal
in a single-point ground. The transistor and 5-k
potentiometer sample the oscillator waveform and apply an
adjustable ramp to the ISENSE terminal.
2N2222
4.7 k
1 k
Error Amplifier
Adjust
4.7 k
5 k
ISENSE
Adjust
RT
100 k
COMP
VFB
ISENSE
RT/CT
REF
OUTPUT
GND
VCC
0.1
μ
F
0.1
μ
F
REF
VCC
OUTPUT
GND
1 k
, 1 W
A
CT
TL284x
TL384x
DUT
Figure 6. Open-Loop Laboratory Test Fixture
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