參數(shù)資料
型號(hào): TL2217-285Y
廠商: Texas Instruments, Inc.
英文描述: FIXED-VOLTAGE REGULATORS FOR SCSI ACTIVE TERMINATION
中文描述: 固定用于SCSI主動(dòng)終止電壓調(diào)節(jié)器
文件頁數(shù): 3/6頁
文件大?。?/td> 79K
代理商: TL2217-285Y
TL2217-285
FIXED-VOLTAGE REGULATORS
FOR SCSI ACTIVE TERMINATION
SLVS066F – NOVEMBER 1991 – REVISED JULY 1999
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions, V
I
= 4.5 V, I
O
= 500 mA, T
J
= 25
°
C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
TL2217-285
MIN
2.81
UNIT
TYP
2.85
MAX
2.89
Output voltage
IO= 20 mA to 500 mA
IO = 20 mA to 500 mA,
VI= 3 85 V to 5 5 V
VI = 3.85 V to 5.5 V
TJ = 25
°
C
TJ = 0
°
C to 125
°
C
V
2.765
2.935
Input voltage regulation
VI = 3.85 V to 5.5 V
f = 120Hz,
5
15
mV
Ripple rejection
Vripple = 1 VPP
–62
dB
Output voltage regulation
IO = 20 mA to 500 mA
f = 10 Hz to 100 kHz
5
30
mV
μ
V
V
Output noise voltage
500
Dropout voltage
1
IO = 0
IO = 27 mA, equivalent 1 line asserted
IO = 500 mA, equivalent 18 lines asserted (8 bit)
2
5
Bias current
3
6
mA
26
49
Pulse-testing techniques are used to maintain the virtual junction temperature as close to the ambient temperature as possible. Thermal effects
must be taken into account separately. All characteristics are measured with a 0.1-
μ
F capacitor across the input and a 22-
μ
F tantalum capacitor
with equivalent series resistance of 1.5
on the output.
electrical characteristics over recommended operating conditions, V
I
= 4.5 V, I
O
= 500 mA, T
J
= 25
°
C
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
TL2217-285Y
MIN
UNIT
TYP
MAX
Output voltage
IO = 20 mA to 500 mA,
VI = 3.85 V to 5.5 V
f = 120 Hz,
VI = 3.85 V to 5.5 V
2.81
2.85
2.89
V
Input voltage regulation
5
15
mV
Ripple rejection
Vripple = 1 VPP
–62
dB
Output voltage regulation
IO = 20 mA to 500 mA
f = 10 Hz to 100 kHz
5
30
mV
μ
V
V
Output noise voltage
500
Dropout voltage
IO = 500 mA
IO = 0
IO = 27 mA, equivalent 1 line asserted
IO = 500 mA, equivalent 18 lines asserted (8 bit)
1
2
5
Bias current
3
6
mA
26
49
Pulse-testing techniques are used to maintain the virtual junction temperature as close to the ambient temperature as possible. Thermal effects
must be taken into account separately. All characteristics are measured with a 0.1-
μ
F capacitor across the input and a 22-
μ
F tantalum capacitor
with equivalent series resistance of 1.5
on the output.
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