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    參數(shù)資料
    型號: TE28F160B3T120
    廠商: INTEL CORP
    元件分類: DRAM
    英文描述: SMART 3 ADVANCED BOOT BLOCK WORD-WIDE
    中文描述: 1M X 16 FLASH 3V PROM, 120 ns, PDSO48
    封裝: 12 X 20 MM, TSOP-48
    文件頁數(shù): 14/49頁
    文件大?。?/td> 427K
    代理商: TE28F160B3T120
    SMART 3 ADVANCED BOOT BLOCK
    –WORD-WIDE
    E
    14
    PRELIMINARY
    3.0
    PRINCIPLES OF OPERATION
    Flash memory combines EEPROM functionality
    with in-circuit electrical program and erase
    capability. The Smart 3 Advanced Boot Block flash
    memory family utilizes a Command User Interface
    (CUI) and automated algorithms to simplify program
    and erase operations. The CUI allows for 100%
    CMOS-level control inputs, fixed power supplies
    during erasure and programming, and maximum
    EEPROM compatibility.
    When V
    PP
    < V
    PPLK
    , the device will only execute the
    following commands successfully: Read Array,
    Read Status Register, Clear Status Register and
    Read Intelligent Identifier. The device provides
    standard EEPROM read, standby and output
    disable operations. Manufacturer identification and
    device identification data can be accessed through
    the CUI. In addition, 2.7V or 12V on V
    PP
    allows
    program and erase of the device. All functions
    associated with altering memory contents, namely
    program and erase, are accessible via the CUI.
    The internal Write State Machine (WSM) completely
    automates program and erase operations while the
    CUI signals the start of an operation and the status
    register reports status. The CUI handles the WE#
    interface to the data and address latches, as well
    as system status requests during WSM operation.
    3.1
    Bus Operation
    Smart 3 Advanced Boot Block flash memory
    devices read, program and erase in-system via the
    local CPU or microcontroller. All bus cycles to or
    from the flash memory conform to standard
    microcontroller bus cycles. Four control pins dictate
    the data flow in and out of the flash component:
    CE#, OE#, WE# and RP#. These bus operations
    are summarized in Table 3.
    Table 3. Bus Operations for Word-Wide Mode
    Mode
    Notes
    RP#
    CE#
    OE#
    WE#
    WP#
    A
    0
    V
    PP
    DQ
    0
    –15
    Read
    1,2,3
    V
    IH
    V
    IL
    V
    IL
    V
    IH
    X
    X
    X
    D
    OUT
    Output Disable
    2
    V
    IH
    V
    IL
    V
    IH
    V
    IH
    X
    X
    X
    High Z
    Standby
    2
    V
    IH
    V
    IH
    X
    X
    X
    X
    X
    High Z
    Deep Power-Down
    2,9
    V
    IL
    X
    X
    X
    X
    X
    X
    High Z
    Intelligent Identifier (Mfr.)
    2,4
    V
    IH
    V
    IL
    V
    IL
    V
    IH
    X
    V
    IL
    X
    0089 H
    Intelligent Identifier (Dvc.)
    2,4,5
    V
    IH
    V
    IL
    V
    IL
    V
    IH
    X
    V
    IH
    X
    See Table 5
    Write
    2,6,7,
    8
    V
    IH
    V
    IL
    V
    IH
    V
    IL
    X
    X
    V
    PPH
    D
    IN
    NOTES:
    1.
    2.
    3.
    4.
    5.
    6.
    7.
    8.
    9.
    Refer to DC Characteristics.
    X must be V
    IL
    , V
    IH
    for control pins and addresses, V
    PPLK
    , V
    PPH1
    or V
    PPH2
    for V
    PP
    .
    See DC Characteristics for V
    PPLK
    , V
    PPH1
    , V
    PPH2
    voltages.
    Manufacturer and device codes may also be accessed via a CUI write sequence, A
    1
    –A
    19
    = X
    See Table 5 for device IDs.
    Refer to Table 6 for valid D
    IN
    during a write operation.
    Command writes for block erase or word program are only executed when V
    PP
    = V
    PPH1
    or V
    PPH2
    .
    To program or erase the lockable blocks, hold WP# at V
    IH
    . See Section 3.3.
    RP# must be at GND
    ±
    0.2V to meet the maximum deep power-down current specified.
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