參數(shù)資料
型號: TCET2200
廠商: Vishay Intertechnology,Inc.
英文描述: Optocoupler with Phototransistor Output
中文描述: 與光電晶體管光電耦合器輸出
文件頁數(shù): 5/13頁
文件大?。?/td> 231K
代理商: TCET2200
TCET120.(G) up to TCET2200
Vishay
Semiconductors
www.vishay.com
Document Number 83501
Rev. A2, 08–Feb–01
5 (12)
Maximum Safety Ratings
(according to VDE 0884) see figure 1
This device is used for protective separation against electrical shock only within the maximum safety ratings.
This must be ensured by using protective circuits in the applications.
Input (Emitter)
Parameters
Test Conditions
Symbol
I
si
Value
130
Unit
mA
Forward current
Output (Detector)
Parameters
Test Conditions
T
amb
25 C
Symbol
P
si
Value
265
Unit
mW
Power dissipation
Coupler
Parameters
Test Conditions
Symbol
V
IOTM
T
si
Value
8
150
Unit
kV
C
Rated impulse voltage
Safety temperature
Insulation Rated Parameters
(according to VDE 0884)
Parameter
Test Conditions
100%, t
test
= 1 s
Symbol
V
pd
Min.
1.6
Typ.
Max.
Unit
kV
Partial discharge test voltage –
Routine test
Partial discharg
Lot test (sample test)
Insulation resistance
t
= 60 s, t
= 10 s,
Tr
(see figure 2)
V
IO
= 500 V
V
IO
= 500 V,
T
amb
= 100 C
V
IO
= 500 V,
T
amb
= 150 C
(construction test only)
V
IOTM
V
pd
R
IO
R
IO
8
kV
kV
g
test
1.3
10
12
10
11
R
IO
10
9
0
25
50
75
125
0
50
100
150
200
300
P
t
T
si
– Safety Temperature (
°
C )
150
94 9182
100
250
Phototransistor
Psi ( mW )
IR-Diode
Isi ( mA )
Figure 1. Derating diagram
t
13930
t
1
, t
2
= 1 to 10 s
t
3
, t
4
= 1 s
t
test
= 10 s
t
stres
= 12 s
V
IOTM
V
Pd
V
IOWM
V
IORM
0
t
1
t
test
t
Tr
= 60 s
t
stres
t
3
t
4
t
2
Figure 2. Test pulse diagram for sample test according to
DIN VDE 0884
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