參數(shù)資料
型號: TC1072-285VCH
廠商: Microchip Technology Inc.
英文描述: 50mA and 100mA CMOS LDOs with Shutdown, ERROR Output and VREF Bypass
中文描述: 為50mA和100mA的CMOS低壓降穩(wěn)壓器具有關斷功能,錯誤輸出和VREF繞道
文件頁數(shù): 2/12頁
文件大?。?/td> 126K
代理商: TC1072-285VCH
PRELIMINARY INFORMATION
TC1072
2
50mA CMOS LDO WITH SHUTDOWN,
ERROR OUTPUT AND V
REF
BYPASS
TC1072-01
6/16/97
ELECTRICAL CHARACTERISTICS:
V
IN
= V
OUT
+ 1V, I
L
= 0.1mA, C
L
= 3.3
μ
F, SHDN > V
IH
, T
A
= 25
°
C, unless other-
wise specified.
BOLDFACE
type specifications apply for junction temperatures of
– 40
°
C to +125
°
C.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
V
IN
I
OUTMAX
V
OUT
TC V
OUT
Input Operating Voltage
Maximum Output Current
Output Voltage
V
OUT
Temperature Coefficient
50
6.5
V
mA
V
Note 1
Note 2
V
R
– 2.5%
V
R
±
0.5%
40
0.05
0.5
V
R
+ 2.5%
ppm/
°
C
V
OUT
/
V
IN
V
OUT
/V
OUT
Line Regulation
Load Regulation
(V
R
+ 1V) < V
IN
< 6V
I
L
= 0.1mA to I
OUTMAX
(Note 3)
I
L
= 0.1mA
I
L
= 20mA
I
L
= 50mA
(Note 4)
I
L
= I
OUTMAX,
(Note 5)
SHDN = V
IH
, I
L
= 0
SHDN = 0V
F
RE
1kHz
V
OUT
= 0V
Note 6
I
L
= I
OUTMAX
470pF from Bypass to GND
%/V
%
V
IN
– V
OUT
Dropout Voltage (Note 4)
5
mV
65
95
I
GND
I
IN
I
INSD
PSRR
I
OUTSC
V
OUT
/
P
D
eN
Ground Pin Current
Supply Current
Shutdown Supply Current
Power Supply Rejection Ratio
Output Short Circuit Current
Thermal Regulation
Output Noise
0
0.05
450
μ
A
μ
A
μ
A
dB
mA
%/W
nV/
Hz
50
64
200
0.04
260
SHDN Input
V
IH
V
IL
SHDN Input High Threshold
SHDN Input Low Threshold
V
IN
= 2.5V to 6.5V
V
IN
= 2.5V to 6.5V
45
15
%V
IN
%V
IN
ABSOLUTE MAXIMUM RATINGS*
Input Voltage .................................................................7V
Output Voltage .................................. (– 0.3) to (V
IN
+ 0.3)
Power Dissipation ....................Internally Limited (Note 7)
Operating Temperature.................... – 40
°
C < T
J
< 125
°
C
Storage Temperature ............................– 65
°
C to +150
°
C
Maximum Voltage on Any Pin ........... V
IN
+ 0.3V to – 0.3V
Lead Temperature (Soldering, 10 Sec.)................+260
°
C
*Stresses beyond those listed under "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
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