參數(shù)資料
型號(hào): TB1245N
元件分類: 消費(fèi)家電
英文描述: SPECIALTY CONSUMER CIRCUIT, PDIP56
封裝: PLASTIC, SDIP-56
文件頁(yè)數(shù): 43/101頁(yè)
文件大?。?/td> 1490K
代理商: TB1245N
TB1245N
2001-07-26
46
CHROMA SECTION
TEST CONDITION (Unless otherwise specified : H, RGB VCC = 9V ; VDD, Fsc VDD, Y / C VCC = 5V ; Ta = 25±3°C)
SW MODE
NOTE
ITEM
S26
S1
S31
S33
S34
S39
S42
S44
S45
S51
MEASURING METHOD
(1) Activate the test mode (S26-ON, Sub Add 02 ; 01h).
(2) Set as follows : band pass filter Q = 2, fo = 600 kHz, crystal clock = conforming to
European, Asian system.
(3) Set the gate to the normal status.
(4) Input 3N rainbow color bar signal to pin 42 (Chroma IN).
(5) When input signal to pin 42 is the same in the burst and chroma levels (10 mVp-p), burst
amplitude of B-Y output signal from pin 36 is expressed as eAT. When the level of input
signal to pin 42 is 100 mVp-p or 300 mVp-p, burst amplitude of the B-Y output signal is
expressed as F1T or F2T. The ratio between F1T and F2T is expressed as AT.
F2T / F1T = AT
(6) Perform the same measurement in the
EXT. mode (fo = 0).
(eAE, F1E, AE)
C1
ACC
Characteristic
ON
A
B
A
B
(7) Input 4N rainbow color bar signal to pin 42 (Chroma IN), and perform the same
measurement as the above-mentioned steps with 3N rainbow color bar signal input.
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