
KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300
14. High Temperature Life Test
105oC, 0.8 x Rated Voltage, 2000 hours, 125oC
for T525, T530 Series
Post Test Performance:
a.
Capacitance: within -20%
/
+10% of initial value
b. DF: within initial limit
c. DC Leakage: within 1.25 initial limits for T520;
2 x initial limit for T525, T530
d. ESR: within 2 x initial limit for T520, T530
ESR: within initial limit for T525
15. Storage Life Test
105oC, 0VDC, 2000 Hours for T520; 125oC for
T525, T530
Post Test Perfomance:
a.
Capacitance: within -20%
/
+10% of initial value
b. DF: within initial limit
c. DC Leakage: within 1.25 initial limits for T520;
2 x initial limit for T525, T530
d. ESR: within 2 x initial limit for T520, T530
ESR: within initial limit for T525
16. Thermal Shock
Mil-Std-202, Method 107, Condition B
Minimum temperature is -55oC
Maximum temperature is +105oC for T520; 125oC
for T525, T530
500 Cycles
Post Test Performance:
a. Capacitance: within +10%/-20% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within 2 x initial limit
17. Moisture Resistance
Testing
J-Std-020
Steps 7a and 7b excluded, 0V, 21 cycles
Post Test Performance:
a. Capacitance: within ±30% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within initial limit
e. JEDEC J-STD-020C Meets MSL Level 3
18. Load Humidity
85oC, 85% RH, Rated Voltage, 500 Hours
Post Test Performance:
a. Capacitance: within +35%/-5% of initial value
b. DF: within initial limit
c. DC Leakage: within 5 x initial limit
d. ESR: within 2 x initial limit
19. ESD
Polymer tantalum capacitors are not sensitive
to Electro-Static Discharge (ESD).
20. Failure Mechanism and Reliability
The normal failure mechanism is dielectric break-
down. Dielectric failure can result in high DC
Leakage current and may proceed to the level of a
short circuit. With sufficient time to charge, heal-
ing may occur by one of two potential mecha-
nisms. The polymer adjacent to the dielectric fault
site may overheat and vaporize, disconnecting the
fault site from the circuit. The polymer may also
Actual power dissipated may be calculated from
the following:
P =I
2
R
Substituting I = E,
P = E
2
R
Z
where:
I = rms ripple current (amperes)
E = rms ripple voltage (volts)
P = power (watts)
Z = impedance at specified frequency (ohms)
R = equivalent series resistance at specified
frequency (ohms)
Using P max from Table 3, maximum allowable
rms
ripple current or voltage may be determined as
follows:
I(max) =
P max/R
These values should be derated at elevated tem-
peratures as follows:
Temperature
Derating Factor
85oC
125oC
ENVIRONMENTAL
Z
2
E(max) = Z
P max/R
.9
.4
12. Temperature Stability
Mounted capacitors withstand extreme tempera-
ture testing at a succession of continuous steps
at +25oC, -55oC, +25oC, +85oC, +105oC, +25oC in
that order*. Capacitors are allowed to stabilize at
each temperature before measurement. Cap, DF,
and DCL are measured at each temperature
except DC Leakage is
not measured at -55oC.
*Maximum temperature 125
oC for T525 and T530 series.
Table 4
Acceptable limits are as follows:
Step
Temp.
1
+25oC
Specified
Tolerance
2
-55oC
±20% of
initial value
3
+25oC
±10% of
initial value
4
+85oC
±20% of
initial value
5
+105oC
±30% of
initial value
Δ
Cap
DCL
Catalog
Limit
N/A
DF
Catalog
Limit
Catalog
Limit
Catalog
Limit
Catalog
Limit
10x Catalog 1.2x Catalog
Limit
10x Catalog 1.5x Catalog
Limit
Limit
(125oC for
Limit
T525, T530)
+25oC
6
±10% of
initial value
Catalog
Limit
Catalog
Limit
13. Standard Life Test
85oC, Rated Voltage, 2000 Hours
Post Test Performance:
a.
Capacitance: within -20%
/
+10% of initial value
b. DF: within initial limit
c. DC Leakage: within initial limit
d. ESR: within initial limit
COMPONENT PERFORMANCE CHARACTERISTICS
CONDUCTIVE POLYMER CHIP CAPACITORS
46