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4
T2525
4657D–AUTO–11/03
ESD
All pins
2000V HBM; 200V MM, MIL-STD-883C, Method 3015.7
Reliability
Electrical qualification (1000h) in molded SO8 plastic package
3.5
Maximum detection
threshold current with
V
IN
> 0V
Test signal:
see Figure 8 on page 7
V
S
= 5 V, T
amb
= 25°C,
I
IN_DC
= 1 μA;
square pp,
burst N = 16,
f = f
0
; t
PER
= 10 ms,
Figure 8 on page 7;
BER = 5%
(2)
3
I
Eemax
-400
μA
D
4
Controlled Amplifier and Filter
4.1
Maximum value of
variable gain (CGA)
G
VARMAX
51
dB
D
4.2
Minimum value of
variable gain (CGA)
G
VARMIN
-5
dB
D
4.3
Total internal
amplification
(3)
G
MAX
71
dB
D
4.4
Center frequency fusing
accuracy of bandpass
V
S
= 5 V, T
amb
= 25°C
f
0_FUSE
-3
f
0
+3
%
A
4.5
Overall accuracy center
frequency of bandpass
f
0
-6.7
f
0
+4.1
%
C
4.6
BPF bandwidth:
type N0 - N3
-3 dB; f
0
= 38 kHz; see
Figure 6 on page 6
B
3.5
kHz
C
BPF bandwidth:
type N6, N7
-3 dB; f
0
= 38 kHz
Figure 6 on page 6
B
5.4
kHz
C
Electrical Characteristics (Continued)
T
amb
= 25°C, V
S
= 5
V unless otherwise specified.
No.
Parameters
Test Conditions
Pin
Symbol
Min.
Typ.
Max.
Unit
Type*
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
Notes:
1. Depending on version, see “Ordering Information”
2. BER = Bit Error Rate; e.g., BER = 5% means that with P = 20 at the input pin 19...21 pulses can appear at the pin OUT
3. After transformation of input current into voltage