參數(shù)資料
型號： SWTS901
廠商： Seoul Semicondutctor Inc.
英文描述： WHITE SIDE VIEW LED
中文描述： 白色發(fā)光二極管側(cè)視圖
文件頁數(shù)： 9/15頁
文件大?。?/td> 574K
代理商： SWTS901
Rev. 1.00
SWTS901
7. Reliability
(1) TEST ITEMS AND RESULTS
TEST ITEM
Test conditions
Note
Number of
Damaged
Reference
Life Test 1
T
a
= 25
°
C;
I
F
= 20 mA
1000 hr
0/20
EIAJ ED-4701
100 101
EIAJ ED-4701
100 101
EIAJ ED-4701
300 307
Life Test 2
T
a
= 25
°
C;
I
F
= 30 mA
500 hr
0/20
Thermal Shock
-30
°
C ~ 85
°
C
(30 min) (30 min)
20 cycle
0/50
High Temperature Life Test
T
a
= 85
°
C;
I
F
= 5 mA
1000 hr
0/20
-
Low Temperature Life Test
T
a
= - 30
°
C;
I
F
= 20 mA
1000 hr
0/20
-
High Temperature Storage
T
a
= 100
°
C
1000 hr
0/50
EIAJ ED-4701
200 201
EIAJ ED-4701
200 202
EIAJ ED-4701
100 102
EIAJ ED-4701
100 103
EIAJ ED-4701
301 302
EIAJ ED-4701
303
EIAJ ED-4701
100 105
EIAJ ED-4701
200 203
MIL-STD
888E
Low Temperature Storage
T
a
= - 40
°
C
1000 hr
0/50
High Humidity Heat Life Test
T
a
= 60
°
C;
RH
= 90%,
I
F
= 20 mA
500 hr
0/20
Humidity Heat Load
T
a
= 85
°
C;
RH
= 85%
1000 hr
0/50
Resistance to Soldering Heat
T
sld
= 260
°
C, 10 sec
Pre treatment; 30
°
C, 70%, 168 hr
T
sld
= 215
±
5
°
C, 3 sec
(Lead Solder)
- 40
°
C ~ 25
°
C ~ 100
°
C ~ 25
°
C
(30 min) (5 min) (30 min) (5 min)
25
°
C ~ 65
°
C ~ - 10
°
C
RH= 90%, 24 hr / 1 cycle
2 time
0/50
Solder ability
(Reflow Soldering)
1 time
over 95%
0/50
Temperature Cycle
100 cycle
0/50
Moisture Resistance Cycle
10 cycle
0/50
ESD
Human Body Mode : 1 kV
1 time
0/50
(2) CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgment
Item
Symbol
Test Condition
Min.
Max.
Forward Voltage
V
F
I
F
= 20 mA
-
U.S.L × 1.2
Reverse Current
I
R
V
R
= 5 V
-
U.S.L × 2.0
Luminous Intensity
I
V
I
F
= 20 mA
L.S.L × 0.5
-
U.S.L. : Upper Standard Level, L.S.L. : Lower Standard Level,
SEOUL SEMICONDUCTOR CO., LTD.
8
SSC-QP-7-03-44(
)
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