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參數(shù)資料
| 型號： | SVSP1A105M |
| 廠商： | NEC Corp. |
| 英文描述： | Surface mount resin molded, Ultra miniaturized chip |
| 中文描述： | 表面貼裝模壓，超微型芯片 |
| 文件頁數(shù)： | 11/16頁 |
| 文件大?。?/td> | 124K |
| 代理商： | SVSP1A105M |
11
SVS SERIES
GUIDE TO APPLICATIONS FOR TANTALUM CHIP CAPACITORS
The failure of the solid tantalum capacitor is mostly classified into a short-circuiting mode and a large leakage
current mode. Refer to the following for reliable circuit design.
1. Expecting Reliability
SVS series tantalum chip capacitors are typically applied to decoupling, blocking, bypassing and filtering.
The SVS series has a very high reliability (low failure rate) in the field. For example, the maximum field failure
rate of an SVS series capacitor with a DC rated voltage of 16 V is 0.0004%/1000 hour (4 Fit) at an applied voltage
of 5 V, operating temperature of 25C and series resistance of 3
.
The maximum failure rate in the field is estimated by the following expression :
λ
: Maximum field failure rate
λ
0
: 1%/1000 hour (The failure rate of the SVS series at the full DC rated voltage at operating
temperature of 85C and series resistance of 3
.)
V : Applied voltage in actual use
V
0
: DC Rated voltage
T : Operating temperature in actual use
T
0
: 85C
120
10
2
7
4
2
10
1
7
4
2
10
0
7
4
2
10
–1
7
4
0.2
0.1
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
2
10
–2
7
4
2
10
–3
7
4
2
10
–4
7
4
2
10
–5
110
100
90
O
F
A
0
80
70
60
50
40
30
20
The nomograph is provided for quick estimation of
maximum field failure rates.
Connect operating temperature T and applied
voltage ratio V/V
0
of interest with a straight line.
The failure rate multiplier F is given at the inter-
section of this line with the model scale. The failure
rate is obtained as
λ
=
λ
0
F.
Examples :
Given V/V
0
= 0.4 and T = 45C. read
F = 4
×
10
–3
Hence,
λ
= 0.004% /1000 hour (40 Fit).
Given V/V
0
= 0.3 and T = 25C, read
F = 4
×
10
–4
Hence,
λ
= 0.0004% /1000 hour (4 Fit).
V
V
0
λ
=
λ
0
3
×
2
T-T
0
10
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