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參數(shù)資料
| 型號(hào)： | SVHD21E106M |
| 廠商： | NEC Corp. |
| 英文描述： | SURFACE MOUNT RESIN MOLDED TANTALUM CHIP CAPACITORS HIGH RELIABILITY |
| 中文描述： | 表面貼裝模壓片式鉭電容器高可靠性 |
| 文件頁數(shù)： | 14/20頁 |
| 文件大?。?/td> | 104K |
| 代理商： | SVHD21E106M |
14
SV/H SERIES
GUIDE TO APPLICATIONS FOR TANTALUM CHIP CAPACITORS
The failure of the solid tantalum capacitor is mostly classified into a short-circuiting mode and a large leakage
current mode. Refer to the following for reliable circuit design.
1. Field failure rate
SV/H Series tantalum chip capacitors are typically applied to decoupling, blocking, by-passing and filtering.
The SV/H Series has a very low failure rate in the field. For example, the maximum field failure rate of an SV/H
Series capacitor with a DC working voltage of 16 V is 0.0002 %/1000 hour (2 Fit) at an applied voltage of 5 V, operating
temperature of 25
°
C and series resistance of 3
.
The maximum failure rate in the field is estimated by following expression:
λ
λ
×
=
10
0
0
3
2
0
V
V
T T
λ
λ
0
: Maximum field failure rate
: 0.5%/1000 hour (The failure rate of the SV/H Series at the full rated DC working voltage at operating
temperature of 85
°
C and series resistance of 3
.)
: Applied voltage in actual use
: Rated DC working voltage
: Operating temperature in actual use
: 85
°
C
V
V
0
T
T
0
The nomograph is provided for quick estima-
tion of maximum field failure rates.
Connect operating temperature T and ap-
plied voltage ratio V/V
0
of interest with a
straight line. The failure rate multiplier F is
given at the intersection of this line with the
model scale. The failure rate is obtained as
λ
=
λ
0
·F.
Examples:
Given V/V
0
= 0.4 and T = 45
°
C, read
F = 4
×
10
–3
.
Hence,
λ
= 0.002%/1000 hour (20 Fit).
Given V/V
0
= 0.3 and T = 25
°
C, read
F = 4
×
10
–4
.
Hence,
λ
= 0.0002%/1000 hour (2 Fit).
120
110
100
90
80
O
F
A
0
70
60
50
40
30
20
10
–5
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
2
4
7
10
–4
2
4
7
10
–3
2
4
7
10
–2
2
4
7
10
–1
2
4
7
10
0
2
4
7
10
1
2
4
7
10
2
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