參數(shù)資料
型號: SSTL16877
廠商: NXP Semiconductors N.V.
英文描述: 14-bit SSTL_2 registered driver with differential clock inputs
中文描述: 14位SSTL_2登記差分時(shí)鐘輸入驅(qū)動(dòng)器
文件頁數(shù): 3/8頁
文件大?。?/td> 75K
代理商: SSTL16877
Philips Semiconductors
14-bit SSTL_2 registered driver with
differential clock inputs
Product specification
SSTL16877
2000 Apr 20
3
PIN DESCRIPTION
PIN NUMBER
SYMBOL
NAME AND FUNCTION
34
RESET
LVCMOS asynchronous master
reset
(Active LOW)
48, 47, 44, 43,
42, 41, 40, 33,
32, 31, 30, 29,
26, 25
D1 – D14
SSTL_2 data inputs
1, 2, 5, 6, 7, 10,
11, 14, 15, 18,
19, 20, 23, 24
Q1 – Q14
SSTL_2 data outputs
35
VREF
SSTL_2 input reference level
3, 8, 13, 17, 22,
27, 36, 46
GND
Ground (0 V)
28, 37, 45
V
CC
V
DDQ
CLK+
CLK–
Positive supply voltage
4, 9, 12, 16, 21
Output supply voltage
38
39
Differential clock inputs
FUNCTION TABLE
INPUTS
OUTPUT
Q
RESET
CLK
CLK
D
L
X
X
X
L
H
H
H
H
L
L
H
L or H
L or H
X
Q
0
H = High voltage level
L = High voltage level
= High-to-Low transition
= Low-to-High transition
X = Don’t care
LOGIC DIAGRAM
SW00312
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
REGISTER
RESET
VREF
D1
D2
AD
D4
D5
D6
D7
D8
D9
D10
D11
D12
D13
D14
CLK+
CLK–
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q8
Q9
Q10
Q11
Q12
Q13
Q14
ABSOLUTE MAXIMUM RATINGS
1, 2
SYMBOL
PARAMETER
CONDITION
LIMITS
UNIT
MIN
–0.5
MAX
+4.6
–50
V
CC
I
IK
V
I
I
OK
V
OUT
DC supply voltage
DC input diode current
DC input voltage
3
DC output diode current
DC output voltage
3
DC output current
Continuous current
4
Storage temperature range
V
V
I
< 0
mA
V
mA
V
–0.5
V
DDQ
+ 0.5
–50
V
DDQ
+ 0.5
±
50
±
100
+150
V
O
< 0
Note 3
–0.5
I
OUT
V
O
= 0 to V
DDQ
V
CC
, V
DDQ
, or GND
mA
T
STG
–65
°
C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150
°
C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
4. The continuous current at V
CC
, V
DDQ
, or GND should not exceed
±
100 mA.
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