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      參數(shù)資料
      型號: SST39LF020-70-4C-B3K
      廠商: Silicon Storage Technology, Inc.
      元件分類: FLASH
      英文描述: 64 Mbit (x16) Multi-Purpose Flash Plus
      中文描述: 64兆位(x16)的多功能閃存加
      文件頁數(shù): 11/29頁
      文件大?。?/td> 474K
      代理商: SST39LF020-70-4C-B3K
      Preliminary Specifications
      16 Mbit Multi-Purpose Flash Plus
      SST39VF1681 / SST39VF1682
      11
      2003 Silicon Storage Technology, Inc.
      S71243-03-000
      11/03
      TABLE 10: DC O
      PERATING
      C
      HARACTERISTICS
      V
      DD
      = 2.7-3.6V
      1
      Symbol
      I
      DD
      Parameter
      Power Supply Current
      Limits
      Max
      Test Conditions
      Address input=V
      ILT
      /V
      IHT2
      , at f=5 MHz,
      V
      DD
      =V
      DD
      Max
      CE#=V
      IL
      , OE#=WE#=V
      IH
      , all I/Os open
      CE#=WE#=V
      IL
      , OE#=V
      IH
      CE#=V
      IHC
      , V
      DD
      =V
      DD
      Max
      CE#=V
      ILC
      , V
      DD
      =V
      DD
      Max
      All inputs=V
      SS
      or V
      DD,
      WE#=V
      IHC
      V
      IN
      =GND to V
      DD
      , V
      DD
      =V
      DD
      Max
      WP#=GND to V
      DD
      or RST#=GND to V
      DD
      Min
      Units
      Read
      3
      Program and Erase
      Standby V
      DD
      Current
      Auto Low Power
      18
      35
      20
      20
      mA
      mA
      μA
      μA
      I
      SB
      I
      ALP
      I
      LI
      I
      LIW
      Input Leakage Current
      Input Leakage Current
      on WP# pin and RST#
      Output Leakage Current
      Input Low Voltage
      Input Low Voltage (CMOS)
      Input High Voltage
      Input High Voltage (CMOS)
      Output Low Voltage
      Output High Voltage
      1
      μA
      μA
      10
      I
      LO
      V
      IL
      V
      ILC
      V
      IH
      V
      IHC
      V
      OL
      V
      OH
      10
      0.8
      0.3
      μA
      V
      V
      V
      V
      V
      V
      V
      OUT
      =GND to V
      DD
      , V
      DD
      =V
      DD
      Max
      V
      DD
      =V
      DD
      Min
      V
      DD
      =V
      DD
      Max
      V
      DD
      =V
      DD
      Max
      V
      DD
      =V
      DD
      Max
      I
      OL
      =100 μA, V
      DD
      =V
      DD
      Min
      I
      OH
      =-100 μA, V
      DD
      =V
      DD
      Min
      0.7V
      DD
      V
      DD
      -0.3
      0.2
      V
      DD
      -0.2
      T10.8 1243
      1. Typical conditions for the Active Current shown on the front page of the data sheet are average values at 25°C
      (room temperature), and V
      DD
      = 3V. Not 100% tested.
      2. See Figure 17
      3. The I
      DD
      current listed is typically less than 2mA/MHz, with OE# at V
      IH.
      Typical V
      DD
      is 3V.
      TABLE 11: R
      ECOMMENDED
      S
      YSTEM
      P
      OWER
      -
      UP
      T
      IMINGS
      Symbol
      T
      PU-READ1
      T
      PU-WRITE1
      Parameter
      Power-up to Read Operation
      Power-up to Program/Erase Operation
      Minimum
      100
      100
      Units
      μs
      μs
      1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
      T11.0 1243
      TABLE 12: C
      APACITANCE
      (Ta = 25°C, f=1 Mhz, other pins open)
      Parameter
      C
      I/O1
      C
      IN1
      Description
      I/O Pin Capacitance
      Input Capacitance
      Test Condition
      V
      I/O
      = 0V
      V
      IN
      = 0V
      Maximum
      12 pF
      6 pF
      1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
      T12.0 1243
      TABLE 13: R
      ELIABILITY
      C
      HARACTERISTICS
      Symbol
      N
      END1,2
      T
      DR1
      I
      LTH1
      Parameter
      Endurance
      Data Retention
      Latch Up
      Minimum Specification
      10,000
      100
      100 + I
      DD
      Units
      Cycles
      Years
      mA
      Test Method
      JEDEC Standard A117
      JEDEC Standard A103
      JEDEC Standard 78
      1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
      2. N
      END
      endurance rating is qualified as a 10,000 cycle minimum for the whole device. A sector- or block-level rating would result in a
      higher minimum specification.
      T13.2 1243
      相關(guān)PDF資料
      PDF描述
      SST39LF020-70-4C-NH 64 Mbit (x16) Multi-Purpose Flash Plus
      SST39LF020-70-4C-NK 64 Mbit (x16) Multi-Purpose Flash Plus
      SST39LF020-70-4C-WH 64 Mbit (x16) Multi-Purpose Flash Plus
      SST39LF020-70-4I-B3K 64 Mbit (x16) Multi-Purpose Flash Plus
      SST39LF020-70-4I-NH 64 Mbit (x16) Multi-Purpose Flash Plus
      相關(guān)代理商/技術(shù)參數(shù)
      參數(shù)描述
      SST39LF020-70-4C-NH 制造商:SST 制造商全稱:Silicon Storage Technology, Inc 功能描述:512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash
      SST39LF020-70-4C-NK 制造商:SST 制造商全稱:Silicon Storage Technology, Inc 功能描述:512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash
      SST39LF020-70-4C-WH 制造商:SST 制造商全稱:Silicon Storage Technology, Inc 功能描述:512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash
      SST39LF020-70-4C-WK 制造商:SST 制造商全稱:Silicon Storage Technology, Inc 功能描述:512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash
      SST39LF020-70-4I-B3H 制造商:SST 制造商全稱:Silicon Storage Technology, Inc 功能描述:512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit (x8) Multi-Purpose Flash