
Mar22-07 RevC SP6125: TSOT-6 PFET Buck Controller
2007 Sipex Corporation
2
ABSOLUTE MAXIMUM RATINGS
Input Voltage……................................................-0.3V to 30V
Lx………………………………………..………….…-2V to 30V
FB……………....................................................-0.3V to 5.5V
Storage Temperature..……..…………...……-65
°
C to 150
°
C
Junction Temperature.....................................-40
°
C to 125
°
C
Lead Temperature (Soldering, 1…0 sec)….…………..300
°
C
ESD Rating……….…….…1kV LX, 2kV all other nodes, HBM
ELECTRICAL SPECIFICATIONS
Specifications
are for T
AMB
=T
J
=25
°
C, and those denoted by
apply over the full operating range, -40
°
C< T
j
<85
°
C. Unless
otherwise specified: V
IN
=4.5V to 29V, C
IN
= 4.7
μ
F.
PARAMETER
MIN
TYP
MAX
UNITS
CONDITIONS
UVLO Turn-On Threshold
4.2
4.35
4.5
V
0
°
C< T
j
<85
°
C
UVLO Turn-Off Threshold
4.0
4.2
4.4
V
0
°
C< T
j
<85
°
C
UVLO Hysterisis
0.2
V
Operating Input Voltage
Range
Operating Input Voltage
Range
4.5
29
V
0
°
C< T
j
<85
°
C
7
29
V
Operating VCC Current
0.3
3
mA
VFB=1.2V
Reference Voltage Accuracy
0.5
1
%
Reference Voltage Accuracy
0.5
2
%
Reference Voltage
0.594
0.6
0.606
V
Reference Voltage
0.588
0.6
0.612
V
Switching Frequency
Peak-to-peak ramp Modulator
255
300
V
IN
/5
345
kHz
V
Minimum ON-Pulse Duration
40
100
ns
Minimum Duty Cycle
Maximum Duty Cycle
Gate Driver Turn-Off
Resistance
Gate Driver Pull-Down
Resistance
Gate Driver Pull-up
Resistance
0
%
%
Internal resistor between GATE and
V
IN
V
IN
=12V, V
FB
=0.5V, Measure
resistance between GATE and VDR
V
IN
=12V, V
FB
=0.7V, Measure
resistance between GATE and V
IN
100
50
60
k
4
8
3
6
V
IN
- VDR voltage difference
4.5
5.5
V
Measure V
IN
– VDR, V
IN
>7V
Overcurrent Threshold
270
300
330
mV
Measure V
IN
- LX
LX pin Input Current
OFF interval during hiccup
25
30
200
35
uA
ms
V
LX
= V
IN
VFB=0.58V, measure between
V
IN
=4.5V and first GATE pulse
Soft start time
3
5
9
ms
SHDN Threshold
0.9
1.0
1.1
V
Apply voltage to FB
SHDN Threshold Hysteresis
100
mV
These are stress ratings only, and functional
operation of the device at these ratings or any other
above those indicated in the operation sections of the
specifications below is not implied. Exposure to
absolute maximum rating conditions for extended
periods of time may affect reliability.