參數(shù)資料
型號(hào): SN75LBC241DB
廠商: Texas Instruments, Inc.
英文描述: LOW-POWER LinBiCMOSE MULTIPLE DRIVERS AND RECEIVERS
中文描述: 低功耗LinBiCMOSE多重驅(qū)動(dòng)器和接收
文件頁數(shù): 6/8頁
文件大小: 129K
代理商: SN75LBC241DB
SN75LBC241
LOW-POWER LinBiCMOS
MULTIPLE DRIVERS AND RECEIVERS
SLLS137E – MAY 1992 – REVISED JANUARY 1999
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
TEST CIRCUIT
VOLTAGE WAVEFORMS
CL = 50 pF
(see Note B)
RL = 1.3 k
0 V
3 V
Output
Input
VOL
VOH
tPHL(R)
Generator
(see Note A)
tPLH(R)
500 ns
10 ns
10 ns
VCC
NOTES: A. The pulse generator has the following characteristics: ZO = 50
, duty cycle
50%.
B. CL includes probe and jig capacitance.
C. All diodes are 1N3064 or equivalent.
RIN
ROUT
See Note C
90%
50%
90%
50%
10%
10%
1.5 V
1.5 V
Figure 2. Receiver Test Circuit and Waveforms for t
PHL
and t
PLH
Measurement
CL = 10 pF
(see Note B)
TEST CIRCUIT
VOLTAGE WAVEFORMS
Output
VOL
VOH
tPHL
tTLH
Generator
(see Note A)
RL
RS-232
Output
tPLH
tTHL
5
μ
s
0 V
NOTES: A. The pulse generator has the following characteristics: ZO = 50
, duty cycle
50%.
B. CL includes probe and jig capacitance.
TIN
TOUT
3 V
Input
10 ns
10 ns
90%
50%
90%
50%
10%
10%
90%
10%
90%
10%
Figure 3. Driver Test Circuit and Waveforms for t
PHL
and t
PLH
Measurement (5-
μ
s Input)
NOTES: A. The pulse generator has the following characteristics: ZO = 50
, duty cycle
50%.
B. CL includes probe and jig capacitance.
SR
6 V
t
THL
or t
TLH
CL
(see Note B)
TEST CIRCUIT
Generator
(see Note A)
RL
RS-232
Output
VOLTAGE WAVEFORMS
0 V
3 V
Output
Input
VOL
VOH
tTHL
tTLH
20
μ
s
10 ns
10 ns
90%
1.5 V
90%
1.5 V
10%
10%
–3 V
–3 V
3 V
3 V
Figure 4. Test Circuit and Waveforms for t
THL
and t
TLH
Measurement (20-
μ
s Input)
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