參數(shù)資料
型號(hào): SN74LVT32244_07
廠商: Texas Instruments, Inc.
英文描述: 3.3-V ABT 32-BIT BUFFER/DRIVER WITH 3-STATE OUTPUTS
中文描述: 的3.3V ABT生根粉32位緩沖/驅(qū)動(dòng)器,三態(tài)輸出
文件頁(yè)數(shù): 4/13頁(yè)
文件大小: 382K
代理商: SN74LVT32244_07
www.ti.com
Absolute Maximum Ratings
(1)
over operating free-air temperature range (unless otherwise noted)
Recommended Operating Conditions
(1)
SN74LVT32244
3.3-V ABT 32-BIT BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCBS748C–OCTOBER 2000–REVISED NOVEMBER 2006
MIN
–0.5
–0.5
–0.5
–0.5
MAX
4.6
UNIT
V
V
V
V
mA
mA
mA
mA
°
C/W
°
C
V
CC
V
I
V
O
V
O
I
O
I
O
I
IK
I
OK
θ
JA
T
stg
Supply voltage range
Input voltage range
(2)
Voltage range applied to any output in the high-impedance or power-off state
(2)
Voltage range applied to any output in the high state
(2)
Current into any output in the low state
Current into any output in the high state
(3)
Input clamp current
Output clamp current
Package thermal impedance
(4)
Storage temperature range
7
7
V
CC
+ 0.5
128
64
–50
–50
40
150
V
I
< 0
V
O
< 0
GKE/ZKE package
–65
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
This current flows only when the output is in the high state and V
> V
.
The package thermal impedance is calculated in accordance with JESD 51-7.
(2)
(3)
(4)
MIN
2.7
MAX
3.6
UNIT
V
V
V
V
mA
mA
ns/V
μ
s/V
°
C
V
CC
V
IH
V
IL
V
I
I
OH
I
OL
t/
v
t/
V
CC
T
A
Supply voltage
High-level input voltage
Low-level input voltage
Input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Power-up ramp rate
Operating free-air temperature
2
0.8
5.5
–32
64
10
Outputs enabled
200
–40
85
(1)
All unused inputs of the device must be held at V
or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
4
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