參數(shù)資料
型號: SN74HC125DB
廠商: Texas Instruments, Inc.
英文描述: QUADRUPLE BUS BUFFER GATES WITH 3-STATE OUTPUTS
中文描述: 翻兩番總線緩沖器門,三態(tài)輸出
文件頁數(shù): 1/6頁
文件大?。?/td> 93K
代理商: SN74HC125DB
SN54HC125, SN74HC125
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS104B – MARCH 1984 – REVISED MAY 1997
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
High-Current 3-State Outputs Interface
Directly With System Bus or Can Drive up
to 15 LSTTL Loads
Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), and Ceramic Flat (W) Packages,
Ceramic Chip Carriers (FK), and Standard
Plastic (N) and Ceramic (J) 300-mil DIPs
description
These quadruple bus buffer gates feature
independent line drivers with 3-state outputs.
Each output is disabled when the associated
output-enable (OE) input is high.
The SN54HC125 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74HC125 is characterized for
operation from –40
°
C to 85
°
C.
FUNCTION TABLE
(each buffer)
INPUTS
OUTPUT
Y
OE
A
L
H
H
L
L
L
H
X
Z
logic symbol
EN
1
2
1A
1Y
3
4
5
2A
2Y
6
10
9
3A
3Y
8
13
12
4A
4Y
11
1OE
2OE
3OE
4OE
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, DB, J, N, and W packages.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1OE
1A
1Y
2OE
2A
2Y
GND
V
CC
4OE
4A
4Y
3OE
3A
3Y
SN54HC125 . . . J OR W PACKAGE
SN74HC125 . . . D, DB, OR N PACKAGE
(TOP VIEW)
3
2 1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3OE
1Y
NC
2OE
NC
2A
1
1
N
3
3
V
4
2
G
N
SN54HC125 . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
Copyright
1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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