參數(shù)資料
型號(hào): SN74CBTLV3861DBQ
廠商: Texas Instruments, Inc.
英文描述: LOW-VOLTAGE 10-BIT FET BUS SWITCH
中文描述: 低電壓10位FET總線開(kāi)關(guān)
文件頁(yè)數(shù): 2/6頁(yè)
文件大?。?/td> 81K
代理商: SN74CBTLV3861DBQ
SN74CBTLV3861
LOW-VOLTAGE 10-BIT FET BUS SWITCH
SCDS041D – DECEMBER 1997 – REVISED NOVEMBER 1999
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic diagram (positive logic)
A1
SW
B1
A10
OE
SW
B10
2
11
23
22
13
simplified schematic, each FET switch
A
(OE)
B
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(see Note 1)
Continuous channel current
Input clamp current, I
IK
(V
I/O
< 0)
Package thermal impedance,
θ
JA
(see Note 2): DBQ package
–0.5 V to 4.6 V
–0.5 V to 4.6 V
128 mA
–50 mA
61
°
C/W
86
°
C/W
46
°
C/W
88
°
C/W
–65
°
C to 150
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DGV package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DW package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
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