參數(shù)資料
型號: SN74CBTLV3126DBQ
廠商: Texas Instruments, Inc.
英文描述: LOW-VOLTAGE QUADRUPLE FET BUS SWITCH
中文描述: 低壓翻兩番F(xiàn)ET總線開關(guān)
文件頁數(shù): 2/6頁
文件大小: 80K
代理商: SN74CBTLV3126DBQ
SN74CBTLV3126
LOW-VOLTAGE QUADRUPLE FET BUS SWITCH
SCDS038D – DECEMBER 1997 – REVISED JULY 1999
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic diagram (positive logic)
1A
1OE
SW
1B
2A
2OE
SW
2B
3A
3OE
SW
3B
4A
4OE
SW
4B
2
1
5
4
9
10
12
13
3
6
8
11
simplified schematic, each FET switch
A
(OE)
B
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(see Note 1)
Continuous channel current
Input clamp current, I
IK
(V
I/O
< 0)
Package thermal impedance,
θ
JA
(see Note 2): D package
–0.5 V to 4.6 V
–0.5 V to 4.6 V
128 mA
–50 mA
127
°
C/W
139
°
C/W
182
°
C/W
170
°
C/W
–65
°
C to 150
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DBQ package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DGV package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
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