- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄365651 > SN74BCT8240ANT (Texas Instruments, Inc.) SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS PDF資料下載
參數(shù)資料
| 型號： | SN74BCT8240ANT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| 中文描述： | 掃描測試設(shè)備與八進(jìn)制反向緩沖器 |
| 文件頁數(shù)： | 21/26頁 |
| 文件大?。?/td> | 473K |
| 代理商： | SN74BCT8240ANT |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁當(dāng)前第21頁第22頁第23頁第24頁第25頁第26頁
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package
Type
LCCC
CDIP
SOIC
Package
Drawing
FK
JT
DW
Pins Package
Qty
1
1
25
Eco Plan
(2)
Lead/Ball Finish
MSL Peak Temp
(3)
5962-9174601Q3A
5962-9174601QLA
SN74BCT8240ADW
ACTIVE
ACTIVE
ACTIVE
28
24
24
TBD
TBD
Call TI
Call TI
CU NIPDAU
Level-NC-NC-NC
Level-NC-NC-NC
Level-1-260C-UNLIM
Green (RoHS &
no Sb/Br)
Green (RoHS &
no Sb/Br)
2000 Green (RoHS &
no Sb/Br)
2000 Green (RoHS &
no Sb/Br)
15
Pb-Free
(RoHS)
15
Pb-Free
(RoHS)
1
1
SN74BCT8240ADWE4
ACTIVE
SOIC
DW
24
25
CU NIPDAU
Level-1-260C-UNLIM
SN74BCT8240ADWR
ACTIVE
SOIC
DW
24
CU NIPDAU
Level-1-260C-UNLIM
SN74BCT8240ADWRE4
ACTIVE
SOIC
DW
24
CU NIPDAU
Level-1-260C-UNLIM
SN74BCT8240ANT
ACTIVE
PDIP
NT
24
CU NIPDAU
Level-NC-NC-NC
SN74BCT8240ANTE4
ACTIVE
PDIP
NT
24
CU NIPDAU
Level-NC-NC-NC
SNJ54BCT8240AFK
SNJ54BCT8240AJT
ACTIVE
ACTIVE
LCCC
CDIP
FK
JT
28
24
TBD
TBD
Call TI
Call TI
Level-NC-NC-NC
Level-NC-NC-NC
(1)
The marketing status values are defined as follows:
ACTIVE:
Product device recommended for new designs.
LIFEBUY:
TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND:
Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW:
Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE:
TI has discontinued the production of the device.
(2)
for the latest availability information and additional product content details.Pb-Free (RoHS):
TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Green (RoHS & no Sb/Br):
TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
Eco
Plan
-
The
planned
eco-friendly
classification:
Pb-Free
(RoHS)
or
Green
(RoHS
&
no
Sb/Br)
-
please
check
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:
The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
PACKAGE OPTION ADDENDUM
www.ti.com
26-Sep-2005
Addendum-Page 1
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN74BCT8240ANTE4 | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| SN74BCT8374ANTE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
| SN54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
| SN54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
| SN74BCT8374ANT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8240ANTE4 | 功能描述:特定功能邏輯 Device w/Octal Inverting Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8244ADW | 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8244ADWE4 | 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8244ADWG4 | 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Scan Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8244ADWR | 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。