參數(shù)資料
型號: SN74AUP1G07DCKTE4
廠商: TEXAS INSTRUMENTS INC
元件分類: 門電路
英文描述: AUP/ULP/V SERIES, 1-INPUT NON-INVERT GATE, PDSO5
封裝: GREEN, PLASTIC, SC-70, 5 PIN
文件頁數(shù): 1/23頁
文件大?。?/td> 1074K
代理商: SN74AUP1G07DCKTE4
3
2
4
5
1
N.C.
V
CC
Y
A
GND
DBVPACKAGE
(TOP VIEW)
GND
A
N.C.
6
5
4
2
3
Y
V
CC
1
DRY PACKAGE
(TOP VIEW)
3
2
4
5
1
N.C.
V
CC
Y
A
GND
DCKPACKAGE
(TOP VIEW)
3
2
4
5
1
N.C.
V
CC
Y
A
GND
DRL PACKAGE
(TOP VIEW)
GND
Y
3
4
A
2
5
N.C.
6
1
N.C.
V
CC
DSFPACKAGE
(TOP VIEW)
YZP PACKAGE
(TOP VIEW)
YFP PACKAGE
(TOP VIEW)
GND
DNU
Y
V
CC
A
3
5
2
1
4
A1
B1
C1
A2
C2
A
V
CC
GND
4
2
1
3
Y
A1
B1
A2
B2
www.ti.com
SCES591F – JULY 2004 – REVISED MAY 2010
LOW-POWER SINGLE BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS
Check for Samples: SN74AUP1G07
1
FEATURES
Available in the Texas Instruments NanoStar
Wide Operating VCC Range of 0.8 V to 3.6 V
Package
Optimized for 3.3-V Operation
Low Static-Power Consumption
3.6-V I/O Tolerant to Support Mixed-Mode
(ICC = 0.9 mA Maximum)
Signal Operation
Low Dynamic-Power Consumption
tpd = 3.3 ns Maximum at 3.3 V
(Cpd = 1 pF Typical at 3.3 V)
Suitable for Point-to-Point Applications
Low Input Capacitance (Ci = 1.5 pF Typical)
Latch-Up Performance Exceeds 100 mA Per
Low Noise – Overshoot and Undershoot
JESD 78, Class II
<10% of VCC
ESD Performance Tested Per JESD 22
Ioff Supports Partial-Power-Down Mode
2000-V Human-Body Model
Operation
(A114-B, Class II)
Input Hysteresis Allows Slow Input Transition
1000-V Charged-Device Model (C101)
and Better Switching Noise Immunity at the
Input (Vhys = 250 mV Typ at 3.3 V)
N.C. – No internal connection.
DNU – Do not use
See mechancial drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
The AUP family is TI's premier solution to the industry's low power needs in battery-powered portable
applications. This family ensures a very low static and dynamic power consumption across the entire VCC range
of 0.8 V to 3.6 V, resulting in an increased battery life. This product also maintains excellent signal integrity (see
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright 2004–2010, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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