參數(shù)資料
型號: SN74AS811
廠商: Texas Instruments, Inc.
英文描述: Quadruple 2-Input Exclusive-Nor Gates(四2輸入異或非門(集電極開路輸出))
中文描述: 四2輸入異或非門(四2輸入異或非門(集電極開路輸出))
文件頁數(shù): 1/5頁
文件大小: 81K
代理商: SN74AS811
SN54ALS811, SN54AS811, SN74ALS811, SN74AS811
QUADRUPLE 2-INPUT EXCLUSIVE-NOR GATES
WITH OPEN-COLLECTOR OUTPUTS
SDAS161 – D2837, MARCH 1984–REVISED OCTOBER 1988
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1988, Texas Instruments Incorporated
5BASIC
1
Package Options Include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
Dependable Texas Instruments Quality and
Reliability
description
These
Exclusive-NOR
outputs. They perform the Boolean functions
Y = A
B = (A+B)
(A+B) in positive logic.
devices
contain
gates
four
independent
open-collector
with
A common application is a true/complement
element. If one of the inputs is high, the other input
will be reproduced in true form at the output. If one
of the inputs is low, the signal on the other input will
be reproduced inverted at the output.
The
characterized for operation over the full military
temperature range of –55
°
C to 125
°
C. The
SN74ALS811 and SN74AS811 are characterized
for operation from 0
°
C to 70
°
C.
SN54ALS811
and
SN54AS811
are
logic symbol
3
1Y
1
2
4
5
9
10
12
13
1A
1B
2A
2B
3A
3B
4A
4B
2Y
6
3Y
8
4Y
11
= 1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for D, J, and N packages.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
V
CC
4B
4A
4Y
3B
3A
3Y
SN54ALS811, SN54AS811 . . . J PACKAGE
SN74ALS811, SN74AS811 . . . D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
SN54ALS811, SN54AS811 . . . FK PACKAGE
(TOP VIEW)
1
1
N
3
3
4
2
G
N
V
INPUTS
A
OUTPUT
Y
FUNCTION TABLE
(each gate)
NC–No internal connection
L
L
H
H
H
L
L
H
L
H
L
H
B
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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