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參數(shù)資料
型號: SN74ACT240NSRE4
廠商: Texas Instruments
文件頁數(shù): 14/20頁
文件大小: 0K
描述: IC INVERTER DUAL 4-INPUT 20SOP
標(biāo)準(zhǔn)包裝: 2,000
系列: 74ACT
邏輯類型: 逆變器,緩沖器
電路數(shù): 2
輸入數(shù): 4
特點: 三態(tài)
電源電壓: 4.5 V ~ 5.5 V
電流 - 靜態(tài)(最大值): 4µA
輸出電流高,低: 24mA,24mA
邏輯電平 - 低: 0.8V
邏輯電平 - 高: 2V
額定電壓和最大 CL 時的最大傳播延遲: 8.5ns @ 5V,50pF
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
供應(yīng)商設(shè)備封裝: 20-SO
封裝/外殼: 20-SOIC(0.209",5.30mm 寬)
包裝: 帶卷 (TR)
SN54ACT240, SN74ACT240
OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCAS515C JUNE 1995 REVISED OCTOBER 2002
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 3)
SN54ACT240
SN74ACT240
UNIT
MIN
MAX
MIN
MAX
UNIT
VCC
Supply voltage
4.5
5.5
4.5
5.5
V
VIH
High-level input voltage
2
V
VIL
Low-level input voltage
0.8
V
VI
Input voltage
0
VCC
0
VCC
V
VO
Output voltage
0
VCC
0
VCC
V
IOH
High-level output current
24
mA
IOL
Low-level output current
24
mA
Δt/Δv
Input transition rise or fall rate
8
ns/V
TA
Operating free-air temperature
55
125
40
85
°C
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
V
TA = 25°C
SN54ACT240
SN74ACT240
UNIT
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
I
50 A
4.5 V
4.4
4.49
4.4
IOH = 50 μA
5.5 V
5.4
5.49
5.4
V
I
24 mA
4.5 V
3.86
3.7
3.76
V
VOH
IOH = 24 mA
5.5 V
4.86
4.7
4.76
V
IOH = 50 mA
5.5 V
3.85
IOH = 75 mA
5.5 V
3.85
I
50 A
4.5 V
0.001
0.1
IOL = 50 μA
5.5 V
0.001
0.1
V
I
24 mA
4.5 V
0.36
0.5
0.44
V
VOL
IOL = 24 mA
5.5 V
0.36
0.5
0.44
V
IOL = 50 mA
5.5 V
1.65
IOL = 75 mA
5.5 V
1.65
IOZ
VO = VCC or GND
5.5 V
±0.25
±5
±2.5
μA
II
VI = VCC or GND
5.5 V
±0.1
±1
μA
ICC
VI = VCC or GND,
IO = 0
5.5 V
4
80
40
μA
ΔICC
One input at 3.4 V,
Other inputs at GND or VCC
5.5 V
0.6
1.6
1.5
mA
Ci
VI = VCC or GND
5 V
2.5
pF
Co
VI = VCC or GND
5 V
8
pF
Not more than one output should be tested at a time, and the duration of the test should not exceed 2 ms.
This is the increase in supply current for each input that is at one of the specified TTL voltage levels, rather than 0 V or VCC.
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