參數(shù)資料
型號: SN74ABT8952DWG4
廠商: Texas Instruments
文件頁數(shù): 16/31頁
文件大小: 0K
描述: IC SCAN TEST DEVICE 28SOIC
標(biāo)準(zhǔn)包裝: 20
系列: 74ABT
邏輯類型: 掃描測試設(shè)備,帶寄存總線收發(fā)器
電源電壓: 4.5 V ~ 5.5 V
位數(shù): 8
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 28-SOIC(0.295",7.50mm 寬)
供應(yīng)商設(shè)備封裝: 28-SOIC
包裝: 管件
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
23
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
1.5 V
th
tsu
From Output
Under Test
CL = 50 pF
LOAD CIRCUIT
S1
7 V
Open
GND
500
500
Data Input
Timing Input
1.5 V
3 V
0 V
1.5 V
3 V
0 V
3 V
0 V
1.5 V
tw
Input
(see Note A)
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
PULSE DURATION
tPLH
tPHL
tPLH
VOH
VOL
1.5 V
3 V
0 V
1.5 V
Input
1.5 V
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
VOL
VOH
tPZL
tPZH
tPLZ
tPHZ
1.5 V
3.5 V
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH – 0.3 V
[ 0 V
3 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
Output
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
7 V
Open
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
≤ 10 MHz, ZO = 50 , tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 13. Load Circuit and Voltage Waveforms
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