參數(shù)資料
型號(hào)： SN74ABT8952DLG4
廠商： Texas Instruments
文件頁數(shù)： 8/31頁
文件大?。?/td> 0K
描述： IC SCAN TESST DEVICE 28-SSOP
標(biāo)準(zhǔn)包裝： 40
系列： 74ABT
邏輯類型： 掃描測(cè)試設(shè)備，帶寄存總線收發(fā)器
電源電壓： 4.5 V ~ 5.5 V
位數(shù)： 8
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 28-BSSOP（0.295"，7.50mm 寬）
供應(yīng)商設(shè)備封裝： 28-SSOP
包裝： 管件
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
16
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
simultaneous PSA and PRPG (PSA/PRPG)
Data appearing at the selected device input pins is compressed into an 8-bit parallel signature in the
shift-register elements of the selected input BSCs on each rising edge of TCK. This data is updated in the
shadow latches of the selected input BSCs and applied to the inputs of the normal on-chip logic. At the same
time, an 8-bit pseudo-random pattern is generated in the shift-register elements of the selected output BSCs
on each rising edge of TCK, updated in the shadow latches, and applied to the associated device output pins
on each falling edge of TCK. Figures 8 and 9 illustrate the 8-bit linear-feedback shift-register algorithms through
which the signature and patterns are generated. An initial seed value should be scanned into the BSR before
performing this operation. A seed value of all zeroes does not produce additional patterns.
=
MASKX
A8-I
B8-O
A7-I
A6-I
A5-I
A4-I
A3-I
A2-I
A1-I
B7-O
B6-O
B5-O
B4-O
B3-O
B2-O
B1-O
Figure 8. 8-Bit PSA/PRPG Configuration (OEAB = 0, OEBA = 1)
=
MASKX
B8-I
A8-O
B7-I
B6-I
B5-I
B4-I
B3-I
B2-I
B1-I
A7-O
A6-O
A5-O
A4-O
A3-O
A2-O
A1-O
Figure 9. 8-Bit PSA/PRPG Configuration (OEAB = 1, OEBA = 0)
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