參數(shù)資料
型號(hào)： SN74ABT3614PQ
廠商： Texas Instruments, Inc.
英文描述： 64 】 36 】 2 CLOCKED BIDIRECTIONAL FIRST-IN, FIRST-OUT MEMORY WITH BUS MATCHING AND BYTE SWAPPING
中文描述： 64】36】2時(shí)鐘雙向第一的，在總線匹配和字節(jié)交換先出存儲(chǔ)器
文件頁(yè)數(shù)： 1/41頁(yè)
文件大?。?/td> 636K
代理商： SN74ABT3614PQ
SN74ABT3614
64
×
36
×
2 CLOCKED BIDIRECTIONAL FIRST-IN, FIRST-OUT MEMORY
WITH BUS MATCHING AND BYTE SWAPPING
SCBS126H – JUNE 1992 – REVISED APRIL 2000
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Free-Running CLKA and CLKB Can Be
Asynchronous or Coincident
Two Independent 64
×
36 Clocked FIFOs
Buffering Data in Opposite Directions
Mailbox-Bypass Register for Each FIFO
Dynamic Port-B Bus Sizing of 36 Bits (Long
Word), 18 Bits (Word), and 9 Bits (Byte)
Selection of Big- or Little-Endian Format for
Word and Byte Bus Sizes
Three Modes of Byte-Order Swapping on
Port B
Programmable Almost-Full and
Almost-Empty Flags
Microprocessor Interface Control Logic
EFA, FFA, AEA, and AFA Flags
Synchronized by CLKA
EFB, FFB, AEB, and AFB Flags
Synchronized by CLKB
Passive Parity Checking on Each Port
Parity Generation Can Be Selected for Each
Port
Low-Power Advanced BiCMOS Technology
Supports Clock Frequencies up to 67 MHz
Fast Access Times of 10 ns
Package Options Include 120-Pin Thin
Quad Flat (PCB) and 132-Pin Quad Flat
(PQ) Packages
description
The SN74ABT3614 is a high-speed, low-power BiCMOS bidirectional clocked FIFO memory. It supports clock
frequencies up to 67 MHz and has read-access times as fast as 10 ns. Two independent 64
×
36 dual-port SRAM
FIFOs in this device buffer data in opposite directions. Each FIFO has flags to indicate empty and full conditions
and two programmable flags, almost full (AF) and almost empty (AE) to indicate when a selected number of
words is stored in memory. FIFO data on port B can be input and output in 36-bit, 18-bit, and 9-bit formats, with
a choice of big- or little-endian configurations. Three modes of byte-order swapping are possible with any
bus-size selection. Communication between each port can bypass the FIFOs via two 36-bit mailbox registers.
Each mailbox register has a flag to signal when new mail has been stored. Parity is checked passively on each
port and can be ignored if not desired. Parity generation can be selected for data read from each port.
The SN74ABT3614 is a clocked FIFO, which means each port employs a synchronous interface. All data
transfers through a port are gated to the low-to-high transition of a continuous (free-running) port clock by enable
signals. The continuous clocks for each port are independent of one another and can be asynchronous or
coincident. The enables for each port are arranged to provide a simple bidirectional interface between
microprocessors and/or buses controlled by a synchronous interface.
The full flag and almost-full flag of a FIFO are two-stage synchronized to the port clock that writes data to its
array. The empty flag and almost-empty flag of a FIFO are two-stage synchronized to the port clock that reads
data from its array.
The SN74ABT3614 is characterized for operation from 0
°
C to 70
°
C.
For more information on this device family, see the following application reports:
FIFO Mailbox-Bypass Registers: Using Bypass Registers to Initialize DMA Control
(literature number SCAA007)
Advanced Bus-Matching/Byte-Swapping Features for Internetworking FIFO Applications (literature
number SCAA014)
Parity-Generate and Parity-Check Features for High-Bandwidth-Computing FIFO Applications
(literature number SCAA015)
Internetworking the SN74ABT3614 (literature number SCAA015)
Metastability Performance of Clocked FIFOs(literature number SCZA004)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright
2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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