參數(shù)資料
型號(hào)： SN74ABT18245ADGG
廠商： TEXAS INSTRUMENTS INC
元件分類： 總線收發(fā)器
英文描述： ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, PDSO56
封裝： PLASTIC, TSSOP-56
文件頁(yè)數(shù)： 31/31頁(yè)
文件大小： 438K
代理商： SN74ABT18245ADGG
SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 44 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin, one BSC for each normal-function I/O pin (one single cell for both input data and
output data), and one BSC for each of the internally decoded output-enable signals (1OEA, 2OEA, 1OEB,
2OEB). The BSR is used to store test data that is to be applied externally to the device output pins, and/or to
capture data that appears internally at the outputs of the normal on-chip logic and/or externally at the device
input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test/Idle, as determined by the current instruction. At power up
or in Test-Logic-Reset, BSCs 43–40 are reset to logic 0, ensuring that these cells, which control A-port and
B-port outputs, are set to benign values (i.e., if test mode were invoked, the outputs would be at the
high-impedance state). Reset values of other BSCs should be considered indeterminate.
When external data is to be captured, the BSCs for signals 1OEA, 2OEA, 1OEB, and 2OEB capture logic values
determined
by
the
following
positive-logic
equations:
1OEA = 1OE
1DIR, 2OEA = 2OE 2DIR,
1OEB = 1OE
DIR, and 2OEB = 2OE DIR. When data is to be applied externally, these BSCs control the
drive state (active or high impedance) of their respective outputs.
The BSR order of scan is from TDI through bits 43–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
43
2OEB
35
2A9-I/O
26
1A9-I/O
17
2B9-I/O
8
1B9-I/O
42
1OEB
34
2A8-I/O
25
1A8-I/O
16
2B8-I/O
7
1B8-I/O
41
2OEA
33
2A7-I/O
24
1A7-I/O
15
2B7-I/O
6
1B7-I/O
40
1OEA
32
2A6-I/O
23
1A6-I/O
14
2B6-I/O
5
1B6-I/O
39
2DIR
31
2A5-I/O
22
1A5-I/O
13
2B5-I/O
4
1B5-I/O
38
1DIR
30
2A4-I/O
21
1A4-I/O
12
2B4-I/O
3
1B4-I/O
37
2OE
29
2A3-I/O
20
1A3-I/O
11
2B3-I/O
2
1B3-I/O
36
1OE
28
2A2-I/O
19
1A2-I/O
10
2B2-I/O
1
1B2-I/O
27
2A1-I/O
18
1A1-I/O
9
2B1-I/O
0
1B1-I/O
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run test
(RUNT) instruction to implement additional test operations not included in the basic SCOPE
instruction set.
Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that
are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The BCR order of scan is shown in
Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
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SN74ABT18245ADLR 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18245ADLRG4 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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