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參數(shù)資料
| 型號： | SN54LVTH182502A |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT掃描測試裝置(18位通用總線收發(fā)器)) |
| 中文描述： | 的3.3V ABT生根粉掃描測試設(shè)備與18位通用總線收發(fā)器（3.3VABT掃描測試裝置（18位通用總線收發(fā)器）） |
| 文件頁數(shù)： | 2/35頁 |
| 文件大小： | 806K |
| 代理商： | SN54LVTH182502A |
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SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS668A – JULY 1996 – REVISED DECEMBER 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs
other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern
generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of ’LVTH182502A, which are designed to source or sink up to 12 mA, include 25-
series
resistors to reduce overshoot and undershoot.
The SN54LVTH18502A and SN54LVTH182502A are characterized for operation over the full military
temperature range of –55
°
C to 125
°
C. The SN74LVTH18502A and SN74LVTH182502A are characterized for
operation from –40
°
C to 85
°
C.
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
N
T
1
1
1
1
G
1
1
T
N
T
2
2
2
G
2
2
2
T
2
2
1
1
G
2
2
2
G
1
1
1
SN54LVTH18502A, SN54LVTH182502A . . . HV PACKAGE
(TOP VIEW)
C
V
C
NC – No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
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44
10
11
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28 29 30 31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
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