參數(shù)資料
型號: SN54HC27W
廠商: Texas Instruments, Inc.
元件分類: 基準電壓源/電流源
英文描述: 300mA, 2.5V ±1% Output Voltage, Low Dropout Voltage Regulator with Enable; Package: SOIC-8 Narrow Body; No of Pins: 8; Container: Tape and Reel; Qty per Container: 2500
中文描述: 三重3輸入陽性或非門
文件頁數(shù): 1/5頁
文件大?。?/td> 76K
代理商: SN54HC27W
SN54HC27, SN74HC27
TRIPLE 3-INPUT POSITIVE-NOR GATES
SCLS088B – DECEMBER 1982 – REVISED MAY 1997
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Package Options Include Plastic
Small-Outline (D) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These devices contain three independent 3-input
NOR gates. They perform the Boolean function
Y = A + B + C or Y = A
B
C in positive logic.
The SN54HC27 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74HC27 is characterized for
operation from –40
°
C to 85
°
C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
Y
A
B
C
H
X
X
L
X
H
X
L
X
X
H
L
L
L
L
H
logic symbol
1
1A
2
1B
1Y
12
13
1C
3
2A
5
2C
9
3A
2Y
6
10
3B
11
3C
3Y
8
4
2B
1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, and W packages.
logic diagram (positive logic)
A
B
C
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
2A
2B
2C
2Y
GND
V
CC
1C
1Y
3C
3B
3A
3Y
SN54HC27 . . . J OR W PACKAGE
SN74HC27 . . . D OR N PACKAGE
(TOP VIEW)
3
2 1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
1Y
NC
3C
NC
3B
2A
NC
2B
NC
2C
1
1
N
3
3
V
1
2
G
N
SN54HC27 . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
Copyright
1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
相關PDF資料
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